X-rite Gmbh

Coherix, Inc.

Michael J Mater

Jon Nisper

Bernard J Berg

Alex Klooster

Timothy L Walker

Zhenhua Huang

Jon K Nisper

A system () for sensing a temperature of a light emitting diode (LED). The system may comprise an LED having a spectral output centered at a first wavelength, a first filter () that transitions from attenuation to transmission at about the first wavelength, and a second filter () that transitions from transmission to attenuation at about the first wavelength. The system may also comprise a first sensor () positioned to sense a first intensity of the LED through the first filter and a second sensor () positioned to sense a second intensity of the LED through the second filter. It will be appreciated that a single sensor may be substituted instead of the first and second sensors, provided that the single sensor is capable of selectively viewing the LED through the first and the second filters. The system may also comprise a computer () configured to derive a temperature of the LED considering the first intensity and the second intensity.

Sensing temperature of a light emitting diode

An optical system comprising an optical instrument and a processing unit. The optical instrument may comprise an illumination source and a sensor. The processing unit may comprise a data storage having stored thereon a characterization of the illumination source and a characterization of the sensor. The processing unit may also comprise a computer configured to calculate a system response of the illumination source and the receiving element considering the characterization of the illumination source and the characterization of the receiving element.

Apparatus and methods for facilitating calibration of an optical instrument

An optical assembly is disclosed that includes an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece defines an illumination channel extending from the illumination source toward the first side, a detection channel extending from the first side toward the detection sensor, and a monitor channel extending from the illumination channel toward the monitor sensor. A spectrophotometer is also disclosed that includes a circuit board, illumination source and one or more sensors. The circuit board includes an optically transparent region, wherein the illumination source is mounted and situated relative to a first surface of the circuit board, so as to direct light through the optically transparent region. Each sensor is mounted and situated relative to a second surface of the circuit board opposite the first surface.

Optical instrument and parts thereof for optimally defining light pathways

Multiwavelength interferometric images have the phase and/or frequency of the illuminating light corrected by statistically analyzing the data, and adjusting the phase and/or frequency until a statistical measure reaches a criterion.

Statistical method of generating a synthetic hologram from measured data

A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt angle and direction correction is added, and a third phase image is generated. Phase images of objects which are too large to be imaged in an interferometric imaging system can thus be produced.

Method of combining holograms

An interferometry method using a laser of nominally fixed&#x2014;but unknown and changing&#x2014;frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of the object. The wavelength is reconstructed from the sampled patterns using a correlation algorithm. The phase angle is determined using an n-bucket algorithm. After all of the complex information has been determined at all of the multiple wavelengths, the surface of the object is calculated using conventional interferometry techniques. Accordingly, laser drift&#x2014;typically considered a negative attribute&#x2014;is used positively.

Interferometry method based on the wavelength drift of an illumination source

A color measurement instrument capable of measuring both the nonpolarized spectral response and the polarized spectral response of a sample on a single reading. The instrument includes a source of polarized light to illuminate the sample, and a detector for measuring the light reflected by the sample. A rotatable filter wheel is located between the sample and the detector. Nonpolarizing bandpass filters and polarizing bandpass filters are mounted in the wheel in a circular configuration. A drive mechanism rotates the wheel to automatically sequentially align each of the nonpolarizing filters and the polarizing filters with the detector, enabling the instrument to sample both nonpolarized data and polarized data on a single reading.

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Chelsea, MI, United States of America

Michael J Mater