Xilinx, Inc.

Amazon Technologies, Inc.

Google Inc.

National Semiconductor Corporation

Clearwire IP Holdings L.l.c.

Vivint Wireless, Inc.

Vivint, Inc.

Aervivo, Inc.

Michael J Hart

James Karp

Steven P Young

Peter Paul Gelbman

Martin L Voogel

Kevin T Look

Pierre Maillard

Shahin Toutounchi

Marvin Michael Theimer

Anders Samuelsson

Daniel Gitlin

Praful Jain

Zachary Mohamed Shalla

Brian Joseph Collins

John Petry

Serge Hairanian

Salvador Salazar Sepulveda

Ji Luo

Kameswara K Rao

Yakov Karpovich

John K Jennings

Stephen M Trimberger

Austin H Lesea

Kevin R Ross

Zicheng Gary Ling

Zhiyuan Wu

Guoning Hu

Arunkumar Jayaraman

Jongheon Jeong

David Jason Jones

Yanran Chen

Xiao-Jie Yuan

Ashok Gupta

Herkole Sava

Sandy Huang Cook

Stephen John Haynes

Seth Brickman

Yang Xu

Rajkumar Samuel

Albert M Bergemont

Jan Lodewijk De Jong

Venu M Kondapalli

Michael G Ahrens

Carl H Carmichael

Xin X Wu

Sheau-suey Li

Mohammed Fakhruddin

Radko Gerard Bankras

Joseph J Fabula

Peter Rabkin

Arifur Rahman

Robert O Conn

Venkatesan Murali

Tim Tuan

Jun Liu

Martin Harold Manley

Hua Shen

Sharmin Sadoughi

Jane W Sowards

Sundeep Ram Gopal Agarwal

Lakhbeer Singh Sidhu

Philip J Cacharelis

John W Cooksey

Umanath R Kamath

Prabhuram Gopalan

Ramakrishna Kishore Tanikella

Yun Wu

Robert I Fu

Andreas Wolfgang

Adrian Lynam

Bei Zhu

Steven T Reilly

Min-Hsing Chen

Min-Fang Ho

Omar El Ayach

Jason Hruban

Dennis L Segers

Jerry Strandhav

Mini Rawat

Björn Fjelddahl

Jue Arver

Jeongheon Jeong

Bjorn Ulf Anders Sihlbom

Srikanth Sundararajan

Devices and techniques are generally described for sending a first instruction for a device to output first content while the speech-processing device is in an ambient state during a first time period. First feedback data is received indicating that a first action associated with the first content was requested at a first time. A determination is made that the first time is during the first time period. Timing data related to a current time of the device is determined. Second content is determined based at least in part on the first action being requested during the first time period and the timing data. A second instruction is sent effective to cause the device to output second content while in the ambient state during a second time period.

Ambient device state content display

Techniques are described for wireless communication. One method, for processing a request received via a first mesh network using resources of a second mesh network, includes receiving, at a first node, a request that was generated by a requesting node of the first mesh network. The method further includes determining at the first node, based on configuration information about the second mesh network that is different from the first mesh network, that a second node of the second mesh network has an available computing resources level to process data related to the request. In accordance with the determining, the method additionally includes instructing the second node of the second mesh network to process the data related to the request to create requested data. And the requested data is provided to the requesting node of the first mesh network.

Distributed data center

Distributed system resources may be managed by applying user created policies to the resources. To ensure that valid policies are applied, remote validation for the policies may be implemented. A validation event for a policy may be detected. A remote validation agent may be identified for the policy and a validation request sent to the remote validation agent that includes information for validating the policy. The remote validation agent may return a validation result for the policy. If valid, a policy action that triggered the remote validation event for the policy may be allowed. If invalid, the policy action that triggered the remote validation event for the policy may be denied.

Remote policy validation for managing distributed system resources

Multiple edits to a hierarchical data structure may be atomically applied. A request to perform modifications with respect to a portion or the entire hierarchical data structure may be received. A copy of the requested portion of the hierarchical data structure may be created separate from the hierarchical data structure. The portion of the hierarchical data structure may remain available for read access. Modifications may be applied to the copy of the portion of the hierarchical data structure. In response to a request to commit the modifications to the portion of the hierarchical data structure, the copy of the portion of the hierarchical data structure may atomically replace the portion of the hierarchical data structure.

Atomic application of multiple updates to a hierarchical data structure

Resource data objects describing resources in a system may be maintained in multiple different hierarchies for applying policies to manage the resources. Lookup requests may access the different hierarchies to determine which policies are applicable to a given resource based on the policies identified in each of the hierarchies. Modifications to hierarchies may be performed in isolation so that the application of policies in other hierarchies is unchanged by modifications to a different hierarchy. Access restrictions may be enforced with respect to hierarchies so that different users may be permitted access to different hierarchies for system resource management.

Different hierarchies of resource data objects for managing system resources

Examples described herein provide a circuit and methods for self-testing to detect damage to a device, which damage may be caused by an Electro-Static Discharge (ESD) event. In an example, an integrated circuit includes an input/output circuit, an ESD protection circuit, and a system monitor. The input/output circuit has an input/output node. The ESD protection circuit is connected to the input/output node. The system monitor has a driving/measurement node selectively connectable to the input/output node. The system monitor is configured to drive and measure a voltage of the driving/measurement node. The system monitor is further configured to determine, based on driving and measuring the voltage of the driving/measurement node, whether a damaged device is present. The damaged device is in the input/output circuit or the ESD protection circuit.

Electro-static discharge (ESD) damage self-test

Techniques are described for wireless communication. One method includes receiving, at a first node of a mesh network from a second node, a request for data associated with a security and automation system; determining, at the first node, that a third node associated with a plurality of neighboring nodes within the mesh network has an available computing resources level to process the data based on configuration information of the mesh network; and transmitting, from the first node to the third node, a message instructing the third node to process the data.

A device comprising a plurality of transistors; interconnect elements coupled to the plurality of transistors is described. The interconnect elements enable the transfer of signals between the plurality of transistors. The device further includes a cooling element associated with the device, wherein the cooling element is configured to maintain a temperature of a circuit having the plurality of transistors and interconnect elements below a predetermined temperature; wherein one or more parameters of the device is optimized to operate at a temperature below the predetermined temperature. A method of implementing a circuit is also described.

Integrated circuit devices and methods of designing and producing integrated circuits

An integrated circuit (IC) chip having circuitry adapted to detect and unlatch a latched transistor, and methods for operating the same are provided. In one example, an IC chip includes a body, a power rail disposed in the body and coupled to at least one of a plurality of contact pads disposed on the body, and a first core circuit disposed in the body. The first core circuit includes a first current limiting circuit, a silicon controlled rectifier (SCR) device having a first transistor, a second transistor, and a first latch sensing circuit. The first current limiting circuit is coupled to the power rail. First terminals of the first and second transistors are coupled to the first current limiting circuit. The first latch sensing circuit has a first input terminal coupled to second terminals of the first and second transistors. The first latch sensing circuit also has an output terminal coupled to the first current limiting circuit.

Single event latch-up (SEL) mitigation detect and mitigation

An electronics-harmful-radiation (EHR) monitoring system includes an EHR measurement circuit. The EHR measurement circuit includes a first device, a single event upset (SEU) detector circuit configured to determine a first number of SEUs of the first device during a first period, and an EHR measurement generator configured to generate a first EHR value based on the first number of SEUs and the first period.

Method and apparatus for electronics-harmful-radiation (EHR) measurement and monitoring

In a network including a plurality of network nodes interconnected via a plurality of primary links and a controller in communication with the plurality of network nodes, the controller is configured to provide an event profile to the plurality of network nodes, the event profile indicating routing changes to be implemented in a variety of link loss scenarios. Each of the plurality of nodes is configured to determine that a particular link loss event occurred, determine, based on the event profile, routing changes for the particular link loss event, and implement the determined routing changes.

System and method for handling link loss in a network

Examples described herein provide for single event latch-up (SEL) mitigation techniques. In an example, a circuit includes a semiconductor substrate, a first transistor, a second transistor, and a ballast resistor. The semiconductor substrate comprises a p-doped region and an n-doped region. The first transistor comprises an n+ doped source region disposed in the p-doped region of the semiconductor substrate. The second transistor comprises a p+ doped source region disposed in the n-doped region of the semiconductor substrate. The p+ doped source region, the n-doped region, the p-doped region, and the n+ doped source region form a PNPN structure. The ballast resistor is electrically connected in series with the PNPN structure between a power node and a ground node.

Single event latch-up (SEL) mitigation techniques

Examples described herein provide for single event latch-up (SEL) mitigation techniques. In an example, a semiconductor structure includes a semiconductor substrate, a p-type transistor having p+ source/drain regions disposed in a n-doped region in the semiconductor substrate, an n-type transistor having n+ source/drain regions disposed in a p-doped region in the semiconductor substrate, a n+ guard ring disposed in the n-doped region and laterally around the p+ source/drain regions of the p-type transistor, and a p+ guard ring disposed laterally around the n-doped region. The p+ guard ring is disposed between the p-type transistor and the n-type transistor.

Growing community of inventors

Palo Alto, CA, United States of America

Michael J Hart