Bae Systems Information and Electronic Systems Integration Inc.

Michael J Frack

David D Moser

Mark R Shaffer

Daniel L Stanley

Jason F Ross

Brian A Saari

Stephen A Chadwick

Jason T Dowling

Kevin Linger

A clock phase control circuit includes a clock input gate module, first and second shift register divider modules, and a multiplexer. The clock input gate module is configured to produce, based on an oscillating input clock signal, first and second intermediate clock signals. The first shift register divider module is configured to produce at least one first phase clock signal based on the first intermediate clock signal, where the at least one first phase clock signal has a different frequency than the first intermediate clock signal. The second shift register divider module is configured to produce at least one second phase clock signal based on the second intermediate clock signal, where the at least one second phase clock signal has a different frequency than the second intermediate clock signal. The multiplexer is configured to produce an output clock signal by selecting one of the first or second phase clock signals.

Clock phase control

An IC design enhancing tool for automatically reviewing and environmentally hardening an IC design layout. The IC design enhancing tool may be realized, for example, in software that scans through an IC netlist generated by an electronic design automation (EDA) tool and replaces components that are not compliant with one or more hardening criteria. The newly created netlist can then be re-checked by the EDA tool and an iterative process takes place between the EDA tool and the IC design enhancing tool until the final design layout is fully compliant for a given environment. Interrogation of the IC design layout involves determining if at least a portion of the hardware layout netlist meets one or more predetermined hardening criteria. If it does not, then one or more of the hardware components are replaced using one or more predefined hardened components.

Method for radiation hardening of integrated circuits

A scannable-latch random access memory (SLRAM) is disclosed. The SLRAM includes two rows of memory cells. The SLRAM includes a functional data input, a scan data input, a first and second functional data outputs, a scan data output, and a scan enable. The functional data input is connected to a first memory cell in a first and second rows of memory cells. The scan data input is connected to the first memory cell in the first or second row of memory cells. The first and second functional data outputs are connected to a last memory cell in the first and second row of memory cells, respectively. The scan data output is connected to the last memory cell in the first or second row of memory cells. The scan enable allows data to be output from the scan data output or the first and second functional data outputs.

Scannable-latch random access memory

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Reva, VA, United States of America

Michael J Frack