Applied Materials, Inc.

Robert Boschgmbh

Logicvision, Inc.

Michael Howells

Sidharth Bhatia

Zhaozhao Zhu

Jeffrey Yat Shan Au

Shawn Levesque

Raja Sekhar Jetti

Stephen Kenneth Sunter

Lakshmi Venkatraman

Thorsten Kril

Yuan Tian

Martin J Bell

Givargis Avareh Danialy

Saeed Mehr

Stephen V Pateras

Charles Mc Donald

Jatinder Sasan

Hemanth Konanur Nagendra

Portion of a display panel with a graphical user interface

An electronic device manufacturing system that includes a process tool and a tool server coupled to the process tool and comprising a communication node and an evaluation system. The communication node is configured to obtain one or more attributes from an evaluation system and provide a monitoring device comprising a data collection plan that is based on the one or more attributes. The communication node is further configured to register the monitoring device with a process tool. The communication node is further configured to receive, from the process tool, data based on the data collection plan and send the received data to the evaluation system.

Communication node to interface between evaluation systems and a manufacturing system

A wireless networking method includes placing a master device and at least one peripheral device within proximity of each other. A radio frequency request for proximity pairing is transmitted from the peripheral device to the master device. Radio frequency proximity pairing signals implementing the proximity pairing are transmitted from the master device to the peripheral device. The proximity pairing signals are transmitted with a first level of transmission power. After the proximity pairing is complete, operational signals are transmitted from the master device to the peripheral device. The operational signals are transmitted with a second level of transmission power greater than the first level of transmission power.

Low cost proximity pairing mechanism in wireless personal area networks

A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.

Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data

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San Jose, CA, United States of America

Michael Howells