Carl Zeiss Microscopy Gmbh

Michael Gölles

Ingo Kleppe

Wolfgang Singer

Ralf Wolleschensky

Artur Degen

Thomas Kalkbrenner

Helmut Lippert

Matthias Wald

Jörg Siebenmorgen

Lars-Christian Wittig

Ralf Netz

Daniel Schwedt

Yauheni Novikau

Christoph Nieten

Kai Wicker

Robert Hauschild

Toufic Jabbour

Gunther Lorenz

An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.

Arrangement for microscopy and for correction of aberrations

An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. On the basis of a three-dimensional light field represented by corresponding measurement data of the multiplicity of scanning positions, a spatially resolved imaging of the object is generated, said imaging comprising at least two images from different object planes of the object.

Light field imaging with scanning optical unit

A laser scanning microscope having a laser source for fluorescence excitation; a scanning mirror arrangement for scanning a specimen and scanning optics for generating a diffraction-limited reference image plane as a first intermediate image plane; an optical system for demagnified imaging of the reference plane in a second intermediate image plane; an axially slideable mirror in the second intermediate image plane; a beam splitter arrangement between the reference image plane and the optical system; and a tube lens and a first microscope objective for imaging of the reference image plane into a specimen. The imaging of the image is effected with a magnification of M&#x2260;n/n' and/or a magnification of the second intermediate image plane into the specimen according to the equation with |&#x3be;|&#x2260;, and/or the focal plane of the laser deviates from the axial position of the axially movable mirror across its scanning area in the second intermediate image plane.

Laser scanning microscope

Microscope and method for high resolution scanning microscopy of a sample, wherein

High-resolution scanning microscopy

An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0&#xb0; and 90&#xb0; with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Optical transmission system for correcting image errors and microscope with such a transmission system

Growing community of inventors

Jena, Germany

Michael Gölles