At&t Bell Laboratories

Bell Telephone Laboratories

Michael G Strautz

Paul A Baker

An apparatus for mounting ceramic chip carrier devices onto printed circuit boards. The apparatus includes an adapter assembly with contact terminals, which is positioned and secured by a plastic frame to the circuit board, a washer member containing magnetically aligned electrically conductive particles, and a cover or clip to maintain each contact terminal in engagement with the corresponding conductive particles to electrically couple the adapter assembly and printed circuit board with a chip carrier device. This design incorporates features of both metal and elastomeric contact systems. Alternative apparatus for mounting integrated circuit chips onto printed circuit boards is also disclosed. Such apparatus includes an insulating frame, an elastomeric washer member containing electrically conductive particles, and a cover for holding assemblage together. These designs may require a small number of holes in the circuit board or may provide for surface mounting instead.

Chip carrier mounting apparatus

Apparatus for mounting an integrated circuit module (2) on a printed wiring circuit board (3). The apparatus assembly (1) comprises a ring member (13) for use in assembling a generally rectangular insulating member (11) having a plurality of electrical conducting members (10) positioned therein with a plurality of other insulating members (12) to form quadrilateral configurations of first and second contacts (101, 102) for contacting module terminals (20) and the printed wiring circuit board. A one piece cover (14) engages the ring member to spring clamp the module on the rectangular insulating member and maintain each module terminal in engagement with a corresponding first contact to electrically couple the module with the printed wiring circuit board.

Module mounting assembly

Test apparatus for testing the circuits carried by an electrical circuit board (11) through receptacles (10) for mounting electrical components such as dual inline circuit packs (DIPs) (20). The two rows of contacts (16) for receiving the terminals (19) of a DIP of a receptacle (10) are modified to extend over the top of the housing of the receptacle and downward along its sides (13, 14) to present electrical contact surfaces (21). A test plug (22) is provided which has two rows of test terminals (23) extending from an upper surface. The test terminals (23) extend through the body of the plug (22) to terminate in curved contact surfaces (25) corresponding to the contact surfaces (21) on the sides (13, 14) of the receptacle housing. A pair of skirts (26, 27) extend from the sides of the body of the plug (22) outwardly of the terminal contact surfaces (25). The test plug (22) is fitted over a receptacle so that its contact surfaces (25) make frictional contact with the receptacle contact surfaces (21) when the ends of the plug skirts (26, 27) come to rest on the circuit board (11) face. The circuits on the board (11) may thus be tested by means of the plug (22) test terminals (23) without risk of damage to the fragile contacts (16) of a receptacle (10). The width of the skirts (26, 27) is determined so that the testing may be accomplished whether or not a DIP is mounted in the receptacle.

Test apparatus for electrical circuit boards

A strain relief housing for a flat ribbon cable (11) terminating in an electrical connector (10) in which the housing comprises a pair of identical halves (20, 30) each having a flange (27) extending outwardly therefrom for clasping the cable (11) therebetween. Each flange (27) has extending outwardly therefrom at opposite ends a lug (28) and a notch (29), the lug (28) of one flange (27) being adapted to fold into the notch (29) of and about the other flange (27) to pierce a margin (13) at each side of the cable (11).

Growing community of inventors

Columbus, OH, United States of America

Michael G Strautz