Tektronix, Inc.

Michael G Reiney

William G Wilke

Steven R Palmquist

Edward J Cleary, Jr

Gerd H Hoeren

Michael A Mihalik

James J Besemer

An apparatus for time aligning data acquired by one test instrument with corresponding data acquired by another test instrument is disclosed. A set of binary codes, representative of a set of instructions executed by a microprocessor disposed within a user's prototype circuit, are acquired by said one test instrument. With the acquisition of each of said binary codes, a count is developed in a counter indicative of each said acquisition. A multitude of binary data is acquired, independently of the acquisition of the set of binary codes, by said another test instrument, the multitude of binary data being representative of the functions performed by a set of components present within said user's prototype circuit. The binary codes acquired by said one test instrument and the binary data acquired by said another test instrument each have associated therewith a count developed from said counter. A mini-computer receives the binary codes acquired by said one test instrument, the binary data acquired by said another test instrument, and the counts corresponding thereto. The mini-computer time-aligns the binary data acquired by said another test instrument with the binary codes acquired by said one test instrument, using the counts associated therewith. A display of the time-aligned data is developed on a display device. As a result, when an instruction is executed by the microprocessor of the user's prototype circuit, using said display, it is possible to easily analyze the activity which took place among the components present within the user's prototype circuit as a result of the execution of said instruction by said microprocessor.

Method and apparatus for time-aligning data

A method and apparatus for automatically detecting peak values of an applied unknown electrical signal employ a binary search technique in which a digital signal is converted to analog reference voltage levels one bit at a time from the most significant bit to the least significant bit to be compared with the unknown signal until finally a digital signal is produced which corresponds to a peak value. By selecting and controlling the comparator slope, both positive and negative peaks may be detected. The search for positive and negative peaks of signals occurring in one or more signal channels may be interleaved to decrease total detection time. From the detected values, a triggering voltage level may be arithmetically computed.

Method and apparatus for automatically detecting signal levels

A circuit test system using signature analysis allows random probing to detect faults in an assembly under test. Test points on a properly working assembly are probed at random and the signatures obtained are listed in a memory or storage media. Thereafter, when testing other boards these same test points are probed randomly and the signatures are compared to the list of possible good signatures. If a match is found a 'pass' indication is generated and the operator tests another node. If a match is not found, a 'failure' indication is generated and more detailed troubleshooting of circuits at that test node commences.

Signature analysis using random probing and signature memory

A slewed-pulse display is provided for calibrating the time-base axis of an oscilloscope. In a repetitive-sweep display, the leading edges of incrementally delayed successive pulses are slewed across the display screen. Timing and linearity adjustments may be made in the time-base generator circuits so that a leading edge of a pulse is aligned with each vertically scribed graticule line overlaying the display area.

Growing community of inventors

Tigard, OR, United States of America

Michael G Reiney