Agilent Technologies, Inc.

Michael Fleischer-Reumann

Joachim Moll

Guenther Tietz

Peter Schinzel

Heiko Schmitt

Testing a device under test&#x2014;DUT&#x2014;includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Performing a signal analysis based on digital samples in conjunction with analog samples

A method for testing a digital circuit as a Device under Test&#x2014;DUT, including determining a Bit Error Rate&#x2014;BER&#x2014;value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

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Wildberg, Germany

Michael Fleischer-Reumann