Semiconductor Manufacturing International (shanghai) Corporation

Michael Fang

Lei Zhang

Yan Ding

Jindong Pan

Amy Wei

A method for repairing defective memory cells includes receiving an access command having an access address and an access operation. The access address includes a row address and a column address. The method further includes determining whether the row address and the column address are the same as a pre-recorded row address and column address of a defective memory cell. If the row and column addresses of the access address are the same as the respective row and column addresses of the defective memory cell, the method includes replacing the defective memory cell with a redundant memory cell, and executing the access operation using the redundant memory cell.

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Beijing, China

Michael Fang