Texas Instruments Corporation

Michael Erwin

John Gregory Harris

Zhiliang Julian Chen

Steve Clynes

Qiang Luo

A time domain sampling technique for a CMOS imager enables a wide dynamic range and flexibility by employing up to two-degrees of freedom during such sampling. Two degrees of freedom can be achieved by making one or both of an integration time and a reference (e.g., voltage or current) variable during sampling. The sampling (or image capture) is implemented by associating a time with when a pixel has a desired value relative to the reference in response to the pixel receiving incident light. The reference can be fixed or variable during different portions of the sampling, and further can be programmable to implement a desired sampling pattern for a given application.

System and method to facilitate time domain sampling for solid state imager

An imaging architecture is provided employing CMOS imaging sensors. The imaging architecture utilizes time domain sampling techniques to extract image data from a photodiode (PD) pixel array. The CMOS imaging architecture associates time index values with firing of CMOS imaging sensors in response to a capture of an image. The time index values correspond to the brightness of the illumination received by the CMOS imaging sensor. The time index value associated with the firing of the CMOS imaging sensor can be stored and employed in reconstruction of the image. The imaging architecture includes systems and methods for reading and compressing imaging data extracted from the PD pixel array.

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Marlborough, MA, United States of America

Michael Erwin