Freescale Semiconductor,inc.

Motorola Corporation

Nxp Usa, Inc.

Michael E Stanley

Joseph S Vaccaro

Byron G Bynum

Mark Lancaster

Chongli Wu

Praveen Kashyap

Walter V Lowe

A mechanism is provided to determine orientation of a device that includes sources of electromagnetic interference. Data generated by one or more gyroscopes in the device, in conjunction with data generated by one or more accelerometers, can be used to generate an estimate of the change of orientation of the device from the time of a last accurate magnetometer reading. In one embodiment, in order to conserve system power, the gyroscope is kept powered down or in a stand-by state until receiving a control signal to power up. The control signal is provided in advance of the source of electromagnetic interference being powered up, thereby providing an accurate starting point from which magnetometer orientation estimates may be calculated during such interference.

Orientation determination for devices generating electromagnetic interference

Embodiments include systems that include at least one integrated circuit (IC) and methods for their testing. Each IC includes an input interconnect to receive an input signal, a test enable interconnect to receive a test enable signal, and a controller (e.g., a TAP controller) for performing testing of the integrated circuit based on values in at least one register (values corresponding to the input signal). Each IC also includes an input port and a multiplexer coupled to the first input interconnect, the at least one register, and the input port. The multiplexer is controllable to pass the input signal to the input port in response to non-assertion of the test enable signal, and to pass the input signal to the at least one register in response to assertion of the test enable signal. When the system includes multiple controllers, each controller may implement a different opcode-to-instruction mapping.

Methods and apparatus for testing multiple-IC devices

A mechanism by which a MEMS gyroscope sensor can be calibrated using data gathered from other sensors in a system incorporating the MEMS gyroscope sensor is provided. Data gathered from an accelerometer and a magnetometer in fixed orientation relative to the gyroscope is used to calculate changes in orientation of a system. A constant acceleration vector measured by the accelerometer and a constant magnetic vector measured by the magnetometer are used as reference vectors in a solution to Wahba's problem to calculate a rotation matrix providing the system's orientation with respect to those two constant vectors. By comparing changes in orientation from one time to a next time, measured rates of angular change can be calculated. The measured rates of angular change can be used along with observed gyroscope rates of angular change as input to a linear regression algorithm, which can be used to compute gyroscope trim parameters.

Systems and method for gyroscope calibration

Embodiments of integrated circuits include a first input interconnect, a second input interconnect, an output interconnect, a shift register, a select register, a test access port (TAP) controller, and select register decode circuitry. The TAP controller is coupled to the first input interconnect and the select register, and the TAP controller is configured to shift a select value provided on the first input interconnect into the select register. The select register decode circuitry is configured to control, based on the select value, which of a plurality of test data output signals are provided to the output interconnect, where the plurality of test data output signals includes a first test data output signal and a second test data output signal. The first test data output signal is provided by the shift register, and the second test data output signal is received from a second integrated circuit on the second input interconnect.

Apparatus and methods are provided for performing a sampling sequence for a plurality of samples. An analog-to-digital conversion module comprises a sampling module, a register, and a sampling control module coupled to the sampling module and the register. The sampling module is configured to convert analog signals into corresponding digital values in response to sampling trigger signals and the register is configured to maintain scan mode criteria for a plurality of samples. The sampling control module is configured to identify a scan mode criterion for a respective sample of the plurality of samples, automatically generate a sampling trigger signal when the scan mode criterion for the respective sample is equal to a first value, and generate the sampling trigger signal in response to a timing trigger signal when the scan mode criterion for the respective sample is equal to a second value.

Analog-to-digital conversion module adapted for irregular sampling sequences

A pulse width modulator () and method that facilitates high resolution pulse width modulation is provided. The pulse width modulator () creates a pulse width modulated signal having a duty cycle that is proportional to a controllable delay in the modulator. The pulse width modulator combines a first digitally controllable delay () with a delay adjustment () to provide the controllable delay. In one embodiment, a digital counter () is used to provide coarse delay, with the delay adjustment device () coupled to the digital counter () to provide the fine, high resolution, delay control. Together the digital counter () and delay adjustment device () provide high resolution pulse width modulation. In one particular implementation, the analog delay adjustment device () comprises a delay block () designed to provide delay adjustment that is selectively controllable by changing a capacitance in the device.

High resolution pulse width modulator

A method for reducing programming or data errors generated by a new computer program or data set when the computer program updates or replaces an existing computer program. A set of baseline output records is generated by running the existing computer program on an input file (step 701). A set of revised output records is generated by running the new computer program with the input file (step 702). The baseline and revised output records are mapped to form an association between corresponding records (step 707). The associated records are compared using tolerance data stored in a control file to produce a plurality of difference records, a portion of which represents the programming or data errors (step 711). The difference records are examined to identify the portion of the difference records corresponding to the programming or data errors for editing the new computer program.

Smart compare tool and method

A circuit is provided which comprises a push-pull switching stage responsive to applied control signals for alternately establishing high and low output voltage levels at an output of the circuit responsive to control signals which are derived from an applied input logic signal and which is disabled in response to the control signals being disabled for providing a high output impedance at the output. The circuit includes circuitry responsive to an applied disable signal for disabling the control signals while enabling further circuitry, the latter providing a transient current path to improve the transition from the high voltage output level to the high output impedance condition while establishing a pseudo high output impedance at the output of the circuit until the push-pull stage is disabled.

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Mesa, AZ, United States of America

Michael E Stanley