Duke University

Quadridox, Inc.

Optopo Inc. D/b/a Centice Corporation

Michael E Gehm

David Brady

Scott Thomas McCain

Charles B Parker

Jeffrey T Glass

Prasant Potuluri

Michael Sullivan

Jason Amsden

Joel Alter Greenberg

Bob D Guenther

Evan Christopher Cull

Anuj Jawahar Kapadia

Zach Russell

Shane Di Dona

Evan Chen

David Scott Coccarelli

Scott T Mccain

Michael E Sullivan

Estimate material coherent scatter form factors for voxels within a scan object by exposing a series of slices of the scan object to an X-ray fan beam within a coherent scatter scanner. Capturing coherent scatter data at a least two X-ray detector modules that are limited to a small-angle field of view by at least one detector-side angle limiting element to provide for capture of small-angle scatter over a wide field of view. Combining the coherent scatter data from the at least two X-ray detector modules to generate an aggregated collection of estimated material coherent scatter form factors for at least some voxels. Combining the aggregated collection of estimated material coherent scatter form factors with a model of aggregate items that clusters voxels in the scan object into model items. Using the aggregated collection of estimated material coherent scatter form factors to estimate a material type for individual model items.

Method for capture of small-angle scatter over wide fields of view

Disclosed herein are mass spectrometers having segmented electrodes and associated methods. According to an aspect, an apparatus or mass spectrometer includes an ion source configured to generate ions from a sample. The apparatus also includes a detector configured to detect a plurality of mass-to-charge ratios associated with the ions. Further, the apparatus includes segmented electrodes positioned between the ion source and the detector. The apparatus also includes a controller configured to selectively apply a voltage across the segmented electrodes for forming a predetermined electric field profile.

Mass spectrometers having segmented electrodes and associated methods

Aspects of the present disclosure describe systems, methods, and structures for compound-specific coding mass spectrometry wherein compound-specific masks/codes are positioned between an ion source and detector of a mass spectrometer.

Systems, methods, and structures for compound-specific coding mass spectrometry

Embodiments of the present invention relate to systems and methods for spectral imaging. Electromagnetic energy emanating from an object is passed through a first dispersive element, a coded aperture, and a second dispersive element to a detector plane. A wavelength-dependent shift is created by the first dispersive element. The coded aperture modulates the image emanating from the first dispersive element. The wavelength-dependent shift is removed from the modulated image by the second dispersive element producing a wavelength-independent image measured by the detector. A spectral image of the object is calculated from the measured image, a wavelength-dependent shift of the first dispersive element, the code of the coded aperture, and a wavelength dependent shift of the second dispersive element. A spectral image can be calculated from measurements obtained in a single time step and from a number of measurements that is less than the number of elements in the spectral image.

Spatially-registered wavelength coding

An optical spectrometer and/or a method of optical spectroscopy is described herein. One exemplary spectrometer includes a planar spectral filter, a dispersion system, and a detector array having at least two dimensions. The planar spectral filter filters incident light to generate a plurality of wavelength dependent spatial patterns. The dispersion system disperses the spatial patterns along at least one dimension in a wavelength dependent fashion onto the detector array. As a result, spatial patterns corresponding to different wavelengths are centered at different locations on the detector array. The dispersed spatial patterns superimpose at the detector array in an offset but overlapping relationship, creating an asymmetric image that facilitates the spectral analysis of a wide range of light sources, including diffuse or spectrally complex light sources.

Optical spectroscopy utilizing planar spectral filters

A class of aperture coded spectrometer is optimized for the spectral characterization of diffuse sources. The instrument achieves high throughput and high spatial resolution by replacing the slit of conventional dispersive spectrometers with a spatial filter or mask. A number of masks can be used including Harmonic masks, Legendre masks, and Hadamard masks.

Static two-dimensional aperture coding for multimodal multiplex spectroscopy

A coded mass spectrometer incorporates a spatial or temporal code to reduce the resolution/sensitivity dichotomy inherent in mass spectrometry. The code is used to code one or more portions of a mass spectrometer. Coding patterns, such as Hadamard codes, Walsh codes, and perfect code sequences can be used. The coding can be spatial, for example, by using an aperture mask and/or temporal, for example, by coded injection of ions for analysis.

Coded mass spectroscopy methods, devices, systems and computer program products

Embodiments of the present invention relate to systems and methods for spectral imaging. In one embodiment, an image of the scene is formed on a coded aperture of a spectrometer. A coded image from the coded aperture is detected on a two-dimensional detector array of the spectrometer through a spectrally dispersive element of the spectrometer. Data from the two-dimensional detector array is collected as the coded image is varied over time. The spectral image is estimated from the data collected and the variation of the coded image over time. The data collected is varied over time through translation, rotation, and defocus.

Coding and modulation for hyperspectral imaging

An optical spectrometer distinguishes ambiguity between different wavelength constituent components present in incident light. A spatial filter in the spectrometer spatially filters the incident light. A dispersion system receives the spatially filtered light and disperses images of the spatial filter in a wavelength dependent fashion such that two or more wavelength-specific images at least partially overlap at a detector system. The detector system comprises a detector array and processor that detects and processes the dispersed light to remove ambiguity between one or more of the overlapping images. The detector array may detect coded aperture images associated with a coded aperture spatial filter defined by a coded aperture function, and the processor may process the detector array output signals using an analysis function that complements the coded aperture function. The detector system may filter the spatial filter images and electronically process the resulting detector array output signals.

Growing community of inventors

Tucson, AZ, United States of America

Michael E Gehm