Itt Manufacturing Enterprises, Inc.

Michael E Dobbs

Benjamin R Neff

Jeff D Pruitt

Matthew L Gypson

Scott Nelson Mendenhall

James Alexander McAdoo

Peter J Wheel

D Allan Roberts

Allan Roberts

Allan D Roberts

A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.

Method and system for measuring optical properties of a medium using digital communication processing techniques

Remotely sensing a target may include generating a first beam of optical radiation that is modulated at a first frequency and polarized at a first polarization. A second beam of optical radiation that is modulated at a second frequency and polarized at a second polarization may also be generated. The first and second beams of optical radiation may be transmitted to the target. Radiation at the first polarization and radiation at the second polarization may be detected from the target using a phase sensitive technique and the first and second frequencies.

Active multiple-color imaging polarimetry

A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

Active remote sensing using a simultaneous spectral sampling technique

A remote sensing platform for sensing a target may include a source configured to emit optical radiation toward the target. A device may be configured to dither the emitted optical radiation to alternately illuminate a number of locations on the target. A first detector may be configured to detect radiation reflected from a first location of the number of locations and to generate a first signal. A first lock-in amplifier may be configured to process the first signal. A second detector may be configured to detect radiation reflected from a second location of the number of locations and to generate a second signal. A second lock-in amplifier may be configured to process the second signal.

Active remote sensing using lock-in amplifiers and beam steering

A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

Active remote sensing using a spectral lock-in technique

A system for tuning one or more second radiant sources relative to a first radiant source may include a coupler configured to combine output signals from the first radiant source and a second radiant source to generate a heterodyne signal containing a frequency difference between the output signals from the first radiant source and the second radiant source. A photodetector may be configured to convert the heterodyne signal into an electrical signal containing the frequency difference. A spectrum analyzer may be configured to measure the frequency difference in the electrical signal and generate a precise difference value. A controller may be configured to adjust a wavelength of the second radiant source relative to that of the first radiant source based on the precise difference value. Laser spectroscopy may be performed by passing the output signals from the first radiant source and the second radiant source through a sample volume and detecting reflected or emitted radiation.

Laser spectroscopy using a master/slave architecture

A spectrometer may include a radiant source configured to emit radiation and an optical amplifier configured to amply the radiation emitted by the radiant source to produce amplified radiation. A number of optical elements may be configured to produce an interference pattern from the amplified radiation. A detector may detect the interference pattern and generate data from the interference pattern. A processor may be configured to measure one or more from the data.

Systems and methods for amplified optical metrology

A remote platform obtaining a spectrum of one or more locations by moving the platform to sequentially illuminating the locations with different wavelengths of radiation. The different wavelengths of radiation reflected from the locations may be sequentially detected and converted into data. Spectra of the locations may be assembled from the data that was sequentially collected as the platform moved.

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Fort Wayne, IN, United States of America

Michael E Dobbs