Synopsys, Inc.

Michael Durr

Mayukh Bhattacharya

Shan Yuan

Chih Ping Antony Fan

Michal Jerzy Rewienski

Beatrice Solignac

Mira Tzakova

Rayson Yam

This disclosure describes a method for finding equivalent classes of hard defects in a stacked MOSFET array. The method includes identifying the stacked MOSFET array in a circuit netlist. The stacked MOSFET array includes standard MOSFETs sharing gate and bulk terminals. The method further includes determining electrical defects for the standard MOSFETs, grouping the electrical defects into at least one intermediate equivalent defect class based on a topological equivalence of the electrical defects, grouping the electrical defects in the at least one intermediate equivalent defect class into at least one final equivalent defect class based on an electrical equivalence of the electrical defects, performing a defect simulation on an electrical defect in the at least one final equivalent defect class, and attributing a result of the defect simulation on the electrical defect to additional electrical defects in the final equivalent defect class.

Finding equivalent classes of hard defects in stacked MOSFET arrays

A method of simulating defects in an analog circuit design includes, in part, defining a multitude of defect models, defining a defect scope associated with the defect models, and compiling, by a processor, the defect models, the defect scope, and a netlist associated with the analog circuit design. The method further includes, in part, scanning the netlist to identify a multitude of nodes to which a multitude of defects defined by the defect models and the defect scope are applied, injecting the multitude of defects at the identified nodes, and simulating the analog circuit design using the injected defects.

Method and system for custom model definition of analog defects in an integrated circuit

Growing community of inventors

Mountain View, CA, United States of America

Michael Durr