United States of America As Represented by the Secretary of the Air Force

University of Illinois

Michael D Uchic

Dennis M Dimiduk

M Taher A Saif

Robert Wheeler, Iv

Jong H Han

Paul A Shade

The present invention provides a microtesting rig for measuring mechanical properties of small specimens. The rig includes a microsized specimen positioned on a mounting block, an interchangeable contact tip connected with an actuator and configured for contact with the microsized specimen, and a magnifying imaging system for imaging the microsized specimen. The contact tip may be a fiber platen for compression testing or a fiber grip for tension testing.

Microtesting rig with variable compliance loading fibers for measuring mechanical properties of small specimens

Methods and apparatus for testing a microscale or nanoscale sample. A testing stage comprises a frame having first and second laterally opposing ends and first and second side beams. At least one deformable force sensor beam is disposed near the first opposing end and extends laterally between the first and second side beams. A first longitudinal beam, having a free end, bisects the at least one force sensor beam, and a second longitudinal beam has a free end facing the free end of the first longitudinal beam to define a gap therebetween. A support structure comprises a plurality of laterally extending beams disposed such that the second longitudinal beam bisects the plurality of laterally extending beams. Each of a pair of slots disposed at each of the free ends of the first and second longitudinal beams comprises a tapered portion leading to a generally longitudinal portion aligned with the central longitudinal beam. The slots provide a seat for a dogbone-shaped sample.

Apparatus and method for material testing of microscale and nanoscale samples

A dual function indenter for use in a nanoindentation system is disclosed. The indenter of the present invention includes an indentation tip having a machined flat at its distal end forming a compression platen. A sharp imaging probe tip adjacent the machined flat extends parallel to the centerline axis of the indentation tip. The sharp imaging probe tip extends beyond the surface of the machined flat for in situ scanning/imaging of the sample surface.

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Dayton, OH, United States of America

Michael D Uchic