Ge Global Sourcing LLC

Transportation IP Holdings, LLC

Michael Copps

Jared Klineman Cooper

David Michael Peltz

Samuel William Golden

Nicholas Nagrodsky

Jerod Reid Svidunovich

Keith Allen Heob

Systems are provided to determine a location of an electrical fault in an electrical system of a vehicle. A test apparatus can include a control unit and a plurality of scan circuits. The control unit is configured to electrically couple the plurality of scan circuits to the electrical system and trigger the plurality of scan circuits to pass electrical signals to the electrical system. Each scan circuit is configured to detect a presence of an electrical fault in the electrical system based on an electrical signal passed. Each scan circuit provides information indicative of a location of the electrical fault in the electrical system, when detected, to the control unit.

Systems for detecting electrical faults in a vehicle

Growing community of inventors

Melbourne, FL, United States of America

Michael Copps