Ltx Corporation

Optimizely, Inc.

Other

Michael Carlyle Davis

Phillip D Burlison

Mark E Deome

Tommie Edward Berry

Christopher Joel Hannaford

David W Curry

Eric H Rosenfeld

David Menis

Kenneth J Lanier

Roger W Blethen

H Neil Kelly

Jeffrey H Perkins

Edward J Terrenzi

Ali Abbas Rizvi

Travis Beck

Donald Vick Organ

Michael James Connolly, Jr

Wai-Kong Chen

Warren Necoechea

Tim Alton

A method of executing an A/B testing service comprises deploying an instance of the A/B testing service between a client device and an A/B testing server and receiving by the A/B testing service from the A/B testing server a software development kit (SDK) key for a client device, the SDK key indicating an A/B testing environment to be associated with the instance. The method further comprises, in response to receiving the SDK key: storing data associated with the A/B testing environment in memory of the client device; providing a HyperText Transfer Protocol (HTTP) application programming interface (API) associated with the instance of the A/B testing service to one or more applications associated with the A/B testing environment; and executing, by a processing device, commands between the client device and the one or more applications on behalf of the A/B testing environment.

Customizable decision service

A method includes providing, to a third-party content provider, code identifying a feature associated with digital content of the third-party content provider, wherein the identification comprises a feature variable placeholder associated with the feature. The method further includes receiving, by an experimentation platform, an indication of a first event type associated with the digital content, wherein the first event type identifies a first trackable action associated with the feature. The method further includes determining, by a processing device of the experimentation platform, that the first event type does not exist in a configuration associated with the feature; The method further includes, in response to the determining, generating the first event type in the configuration, generating and providing a graphical representation of the first event type for display in a user interface of the experimentation platform, and tracking the first event type on the experimentation platform.

Software development kit driven features and events

An electronic tester with digital, and analog, and memory test circuitry on a single platform. A test head is coupled to a device under test. The device under test can be a system-on-a-chip integrated circuit, a mixed signal integrated circuit, a digital integrated circuit, or an analog integrated circuit. Digital test circuitry applies digital test signals to the device under test coupled to the test head and receives digital outputs from the device under test in response to the digital test signals. Analog test circuitry applies analog test signals to the device under test coupled to the test head and receives analog outputs from the device under test in response to the analog test signals. Memory test circuitry applies memory test patterns to the device under test coupled to the test head and receives memory outputs from the device under test in response to the memory test patterns. A tester computer supervises the application of digital, analog, and memory test signals from the digital, analog, and memory test circuitry to the device under test such that signals applied to the device under test can be solely digital test signals, solely analog test signals, solely memory test signals, or mixed digital, analog, and memory test signals. The test head, the digital test circuitry, the analog test circuitry, the memory test circuitry, and the computer are operable as a single platform.

Single platform electronic tester

A phase-locked loop circuit having a programmable tuning voltage. As the input reference clock frequency is changed, the tuning voltage is changed accordingly to compensate for the propagation delay through the phase detector and thereby reduce discrepancies in the phase relationship between the input reference clock signal and the output clock signal at different frequencies. A set of compensation values corresponding to input reference clock frequencies are stored in a memory device. When the input reference clock frequency is changed, a corresponding compensation value is programmed to a digital-to-analog converter (DAC). The DAC outputs a voltage that is proportional to the value of the digital input to the DAC and can thus be used to regulate the tuning voltage of the PLL circuit so that the relationship of the input reference clock signal to the output clock signal remains stable with frequency changes.

Methods and apparatuses for digitally tuning a phased-lock loop circuit

An electronic tester with digital, and analog, and memory test circuitry on a single platform. A test head is coupled to a device under test. The device under test can be a system-on-a-chip integrated circuit, a mixed signal integrated circuit, a digital integrated circuit, or an analog integrated circuit. Digital test circuitry applies digital test signals to the device under test coupled to the test head and receives digital outputs from the device under test in response to the digital test signals. Analog test circuitry applies analog test signals to the device under test coupled to the test head and receives analog outputs from the device under test in response to the analog test signals. Memory test circuitry applies memory test patters to the device under test coupled to the test head and receives memory outputs from the device under test in response to the memory test patterns. A tester computer supervises the application of digital, analog, and memory test signals from the digital, analog, and memory test circuitry to the device under test such that signals applied to the device under test can be solely digital test signals, solely analog test signals, solely memory test signals, or mixed digital, analog, and memory test signals. The test head, the digital test circuitry, the analog test circuitry, the memory test circuitry, and the computer are operable as a single platform.

A durable lightweight rigid transparent envelope that is slightly curved in shape from top to bottom and attaches to automobile windows via suction cups in order to hold and display a variety of double-sided thin flexible lightweight message sheets, which are highly color-contrasted, light-reflective and contain large font character size messages in order to facilitate visual communication between automobile operators, passengers and pedestrians at distances normally encountered on streets and highways. A selected message can be displayed in the envelope through the envelope's transparent front side when it is attached to the inside of an automobile window, or a selected message can be displayed through the envelope's transparent back side while the envelope is attached to the outside of an automobile window by the same means. Indentations at the top of the envelope provide for quick and easy removal of message sheets by grasping them with the tip of a thumb and finger of the hand Small notches at the top of the envelope provide for the attachment of elastic bands in order to hold the message sheets in place inside the envelope when laying flat while not in use or being stored

Automobile window message display device

Cap removal device

Growing community of inventors

San Jose, CA, United States of America

Michael Carlyle Davis