Organisation Europeenne Pour La Recherche Nucleaire

Ion Beam Applications S.a.

Friedrich-Alexander-Universitat Erlangen-Nürnberg

Czech Technical University in Prague

European Organization for Nuclear Research (cern)

Friedrich-alexander-universitat Erlange-nurnberg

Cern—european Organization For Nuclear Resesarch

Cern-european Organization for Nuclear Research

European Organization for Nuclear Research

Czech Technical University in Prague, Institute of Experimental and Applied Physics

Michael Campbell

Lukas Tlustos

Thilo Michel

Rafael Ballabriga

Winnie Sze-Wing Wong

Gisela Anton

Jan Jakubek

Karl Lehi Schwartz

Ernst Fritsch

Michael Böhnel

Uwe Mollenhauer

Rafael Ballabriga Suñe

Henrious M Heijne

Xavier Llopart-Cudie

Richard Plackett

Henricus M Heijne

Xavier Llopart

Hans-Erik Nilsson

Xavier Llopart Cudie

Karl L Schwartz

Rafael Ballabriga SUÑE

The present invention relates to a pixel detector (), comprising a semiconductor sensor layer (), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer () connected to said semiconductor layer (), said read-out electronics layer () comprising an array of read-out circuits () for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (). The neighboring read-out circuits () are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits (). The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.

Single layer 3D tracking semiconductor detector

Radiation detector for measuring one or more characteristics of a radiation, comprising one or more detector pixels, a clock pulse generator, each detector pixel comprising a sensor producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor; a pixel electronics adapted for receiving and processing said electrical signal, comprising an analog processing unit for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics comprises time determination unit for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters, each event counter counting the number of events having a TOT-count in a predefined ranges.

Radiation monitoring device

A radiation sensing device subdivided in N*M pixels, comprising: a conversion part to convert an impinging radiation into an electrical signal, a processing part having: for each pixel, at least two counters associated to different regions, so that a ratio of counters to pixels is at least equal to 2, an arbitration circuit which, for each pixel: receives detection information from the pixel and neighbouring pixels, taking into account detection information for the pixel and neighbouring pixels, allocates a detection value to an elected counter.

Pixilated radiation sensing device

A method for determining a particle impact on a sensor device comprising M sensing areas, each impact causing a variation of at least one physical magnitude of several sensing portions, said method comprising the steps of: determining an impact center sensing area, where the variation of the at least one physical magnitude is substantially maximal, allocating a result of a sum of the physical magnitude variations of a first set of N sensing areas, said set including the impact center area and other sensing areas neighboring said impact center sensing area, where N is at least 2 and is strict less than M.

Method for determining a particle and sensor device therefor

Growing community of inventors

Geneva, Switzerland

Michael Campbell