International Business Machines Corporation

Michael Brian White

Osamu Takahashi

Garrett Stephen Koch

Steven Ross Ferguson

Sang Hoo Dhong

Brian King Flachs

Louis Bernard Bushard

A method, an apparatus, and a computer program are provided to utilize built-in self test (BIST) latches for multiple purposes. Conventionally, BIST latches are single purpose. Hence, separate latches are utilized for array built-in self test (ABIST) and logic built-in self test (LBIST) operations. By having the separate latches, though, a substantial amount area is lost. Therefore, to better utilize the latches and the area, ABIST latches are reconfigured to utilize some previously unused ports to allow for multiple uses for the latches, such as for LBIST.

Multiple uses for BIST test latches

A method is provided to utilize built-in self test (BIST) latches for multiple purposes. Conventionally, BIST latches are single purpose. Hence, separate latches are utilized for array built-in self test (ABIST) and logic built-in self test (LBIST) operations. By having the separate latches, though, a substantial amount area is lost. Therefore, to better utilize the latches and the area, ABIST latches are reconfigured to utilize some previously unused ports to allow for multiple uses for the latches, such as for LBIST.

The present invention provides for a method for memory array verification. Initialization commands are received and memory array initialization settings are generated based on received initialization commands. The memory array initialization settings are stored in a memory array. A deterministic read output function for the memory array is identified and a logic built-in self test scan on the memory array is performed based on the identified deterministic read output function.

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Michael Brian White