Micron Technology Incorporated

Other

Micron Semiconductor, Inc.

Boise, Idaho

Michael Amiel Shore

Patrick J Mullarkey

Scott James Derner

Jeffrey P Wright

Brian P Callaway

Timoty B Cowles

Todd A Merritt

Hua Zheng

Jiyun Li

Timothy B Cowles

Nathaniel J Meier

Dennis G Montierth

Adam J Grenzebach

Michael S Lane

Brent Keeth

Fatma Arzum Simsek-Ege

Donald M Morgan

Charles L Ingalls

Adrian E Ong

Kurt D Beigel

Huy Thanh Vo

Scott Eugene Smith

Douglas John Cutter

Fan Ho

Suraj J Mathew

Daniel Doyle

Vinay Nair

Diem Thy N Tran

Beau D Barry

Brett M Debenham

Kim M Pierce

Steve V Cole

Matthew D Jenkinson

Dien S Luong

Raghunath Singanamalla

Gloria Yang

Jonathan Scott Parry

Gary L Howe

Shinichi Miyatake

Yoshinori Fujiwara

Jason M Johnson

Aron T Lunde

Robin T Fried

Harish V Gadamsetty

Fernando J Miranda

Apparatuses, systems, and methods for controller directed targeted refresh operations. A memory may be coupled to a controller. The memory may identify aggressor addresses based on sampled addresses. The addresses may be sampled based on internal timing logic of the memory and also based on a sampling command received from the controller. The memory may also receive a controller identified aggressor address from the controller. The memory may refresh one or more victim word lines of the identified (either by the memory or the controller) aggressor addresses as part of a targeted refresh operation. Victims of controller identified aggressor addresses may be refreshed before memory identified aggressor addresses.

Apparatuses, systems, and methods for controller directed targeted refresh operations based on sampling command

Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells are disclosed. The apparatus includes a first memory cell including first and second ferroelectric capacitors configured to store charges representing complementary logical values, a second memory cell including first and second dielectric capacitors configured to store charges representing complementary logical values, a first bit line selectably coupled to the first ferroelectric capacitor of the first memory cell and to the first dielectric capacitor of the second memory cell, a second bit line selectably coupled to the second ferroelectric capacitor of the first memory cell and to the second dielectric capacitor of the second memory cell, and a sense amplifier coupled to the first and second bit lines.

Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells

An apparatus may include a refresh control circuit with multiple timing circuits. The timing circuits may be used to control steal rates, e.g., the rate of refresh time slots dedicated to healing victim word lines of row hammers. The timing circuits may be controlled to allow independent adjustment of the steal rates for different victim word lines. Thus, different victim word lines may be refreshed at different rates and the different rates may be independent of one another.

Apparatuses and methods for controlling steal rates

Apparatuses, systems, and methods for refresh address masking. A memory device may refresh word lines as part of refresh operation by cycling through the word lines in a sequence. However, it may be desirable to avoid activating certain word lines (e.g., because they are defective). Refresh masking logic for each bank may include a fuse latch which stores a selected address associated with a word line to avoid. When a refresh address is generated it may be compared to the selected address. If there is a match, a refresh stop signal may be activated, which may prevent refreshing of the word line(s).

Apparatuses and methods for refresh address masking

Embodiments of the disclosure are drawn to apparatuses and methods for managing access counts of wordlines of a memory. Repeated access to an aggressor wordline may cause increased data degradation in nearby victim wordlines of the memory. The access count of a given wordline may be stored in counter memory cells positioned along that wordline. When the wordline is accessed, the counter memory cells may be read out to refresh circuit, which may determine the access count based on the values stored in the counter memory cells. If the access count is below a threshold, the access count may be incremented and written back to the counter memory cells. If the access count is above the threshold, the refresh circuit may signal that the accessed wordline is an aggressor, and may reset the value of the access count before writing it back to the counter memory cells.

Apparatuses and methods for managing row access counts

Some embodiments include a memory cell having first and second transistors, and a capacitor vertically displaced relative to the first and second transistors. The capacitor has a first node electrically coupled with a source/drain region of the first transistor, a second node electrically coupled with a source/drain region of the second transistor, and capacitor dielectric material between the first and second nodes. Some embodiments include a memory cell having first and second transistors vertically displaced relative to one another, and a capacitor between the first and second transistors. The capacitor has a first node electrically coupled with a source/drain region of the first transistor, a second node electrically coupled with a source/drain region of the second transistor, and capacitor dielectric material between the first and second nodes.

Vertical two-transistor single capacitor memory cells and memory arrays

Apparatuses and methods for compensation of sense amplifiers, for example, threshold voltage compensation, are disclosed. Prime memory sense amplifiers used for accessing prime memory and redundant memory sense amplifiers used for accessing redundant memory are concurrently compensated while determining whether a memory address is remapped from prime memory to redundant memory. Following the determination, sense amplifiers (e.g., prime memory sense amplifiers and/or redundant memory sense amplifiers) that are not used for accessing the memory corresponding to the memory address are precharged.

Apparatuses and methods for compensation of sense amplifiers

Methods, apparatuses, and systems related to scheduling internal operations are described. An apparatus detects a condition associated with repeated accesses to a memory address and/or region. In response to detection of the condition, the apparatus generates a scheduling output that secures a scheduled duration of inactivity for commanded operations. The apparatus initiates execution of one or more internal operations during the scheduled duration.

Apparatus with an internal-operation management mechanism

Some embodiments include an apparatus having memory cells which include capacitors. Bitline pairs couple with each of the memory cells. One of the bitlines within each bitline pair corresponds to a first comparative bitline and the other of the bitlines within each bitline pair corresponds to a second comparative bitline. The bitline pairs extend to sense amplifiers which compare electrical properties of the first and second comparative bitlines to one another. The memory cells are subdivided amongst a first memory cell set using a first set of bitline pairs and a first set of sense amplifiers, and a second memory cell set using a second set of bitline pairs and a second set of sense amplifiers. The second set of bitline pairs has the same bitlines as the first set of bitline pairs, but in a different pairing arrangement as compared to the first set of bitline pairs.

Apparatuses comprising memory cells, and apparatuses comprising memory arrays

Memory devices, systems including memory devices, and methods of operating memory devices in which redundancy match is disabled to permit activating more word lines in parallel during refresh operations to increase a refresh rate of memory cells in a memory array. In one embodiment, a memory device is provided, comprising a memory array including a plurality of word lines arranged in a plurality of memory banks. The memory device further comprises circuitry configured to (i) store a value indicating one or more addresses corresponding to word lines in the plurality of word lines, (ii) disable redundancy match, (iii) activate one or more first word lines in the memory array corresponding to the one or more addresses indicated by the value to refresh first data stored in the memory array, and (iv) update the value based at least in part on activating the one or more first word lines.

Memory with internal refresh rate control

Some embodiments include a memory cell having first and second transistors and first and second capacitors. The first capacitor is vertically displaced relative to the first transistor. The first capacitor has a first node electrically coupled with a source/drain region of the first transistor, a second node electrically coupled with a common plate structure, and a first capacitor dielectric material between the first and second nodes. The second capacitor is vertically displaced relative to the second transistor. The second capacitor has a third node electrically coupled with a source/drain region of the second transistor, a fourth node electrically coupled with the common plate structure, and a second capacitor dielectric material between the first and second nodes. Some embodiments include memory arrays having 2T-2C memory cells.

Vertical 2T-2C memory cells and memory arrays

Systems and methods are provided for implementing an array reset mode. An example system includes at least one mode register configured to enable an array reset mode, a memory cell array including one or more sense amplifiers, and control logic. Each of the one or more sense amplifier may include at least a first terminal coupled to a first bit line and a second terminal coupled to a second bit line. The control logic may be coupled to the memory cell array, and in communication with the at least one mode register. The control logic may be configured to drive, in response to array reset mode being enabled, each of the first and second terminals of the sense amplifier to a bit-line precharge voltage that corresponds to a bit value to be written to respective memory cells associated with each of the first and second bit lines.

Systems and methods for memory cell array initialization

Growing community of inventors

Boise, ID, United States of America

Michael Amiel Shore