Quantum Corporation

La Cie, Ltd.

Tektronix, Inc.

Michael A Mihalik

Kim S Porter

Steven R Palmquist

Gerd H Hoeren

Michael G Reiney

Joel B Kamerman

James J Besemer

Insertable mass storage module

Stackable storage device tower assembly of selectable height

A storage column structure includes multiple storage column elements that interlock together in a vertical stack to form a compact, unitary tower assembly. A power supply module is positioned as a base unit to provide stability for the tower assembly. Each of the remaining storage column elements is adapted to receive and hold a removable modular storage device, such as a disk drive mechanism. Storage column elements are electrically interconnected in the stack to provide for the storage modules held by the storage column elements electrical power and connection to preferably a SCSI bus. The storage column elements are secured together by manually turnable fasteners provided in each storage column element. With the exception of the base unit, each of the storage column elements includes a floor that supports a removable storage device module; therefore, a storage device can be inserted or removed without affecting the structural integrity of the assembly. The electrical connectors providing access to the SCSI bus are placed near the floors of the storage column elements to permit the use of a single storage column element to hold any one of a number of storage device modules of different heights.

Stackable modular storage tower

Stackable modular storage tower assembly of selectable height

An apparatus for time aligning data acquired by one test instrument with corresponding data acquired by another test instrument is disclosed. A set of binary codes, representative of a set of instructions executed by a microprocessor disposed within a user's prototype circuit, are acquired by said one test instrument. With the acquisition of each of said binary codes, a count is developed in a counter indicative of each said acquisition. A multitude of binary data is acquired, independently of the acquisition of the set of binary codes, by said another test instrument, the multitude of binary data being representative of the functions performed by a set of components present within said user's prototype circuit. The binary codes acquired by said one test instrument and the binary data acquired by said another test instrument each have associated therewith a count developed from said counter. A mini-computer receives the binary codes acquired by said one test instrument, the binary data acquired by said another test instrument, and the counts corresponding thereto. The mini-computer time-aligns the binary data acquired by said another test instrument with the binary codes acquired by said one test instrument, using the counts associated therewith. A display of the time-aligned data is developed on a display device. As a result, when an instruction is executed by the microprocessor of the user's prototype circuit, using said display, it is possible to easily analyze the activity which took place among the components present within the user's prototype circuit as a result of the execution of said instruction by said microprocessor.

Method and apparatus for time-aligning data

Growing community of inventors

Beaverton, OR, United States of America

Michael A Mihalik