Analog Devices International Unlimited Company

Analog Devices Global

Michael A Looby

Alan J O'Donnell

Edward John Coyne

David J Clarke

David Aherne

Mark Forde

Colm Patrick Heffernan

Kevin B Manning

Shaun Bradley

David M Boland

Thomas G O'Dwyer

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Lifetime indicator system

Exposure monitor device

Wear-out monitor device

The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.

Growing community of inventors

Ballysheedy, Ireland

Michael A Looby