Analog Devices,inc.

Linear Technology Corporation

Analog Devices International Unlimited Company

Micah Galletta O'Halloran

Andrew Joseph Thomas

Joseph L Sousa

Florin Alexandru Oprescu

Jesper Steensgaard-Madsen

Baozhen Chen

Lalinda D Fernando

Alex Robert Sloboda

Andrew Wayne Shaw

Clement Joseph Wagner

A laminate substrate panel may include an upper layer at or near a top surface of the panel. The laminate substrate panel may include a lower layer at or near a bottom surface of the panel. The laminate substrate panel may also include an array of functional laminate cells, each functional laminate cell of the array having a first upper pattern in the upper layer and a first lower pattern in the lower layer. The laminate substrate panel may also include a dummy laminate cell adjacent the array of functional laminate cells, the dummy laminate cell having a second upper pattern in the upper layer and a second lower pattern in the lower layer, the second upper and lower patterns configured to compensate for at least one of an opposing layer area density mismatch and a material density in at least one of the first upper and lower patterns.

Laminate substrate for integrated device packages

A measurement circuit comprises an input terminal to receive a current signal, a first circuit branch coupled to the first terminal and including one or more circuit elements to receive a portion of the current signal, a second circuit branch coupled to the first terminal and including one or more additional circuit elements to receive another portion of the current signal, a nonlinear circuit element coupling the first circuit branch to the second circuit branch, and a quantization circuit configured to produce an input current measurement of current in the first and second circuit branches, and to include current in the second circuit branch in the input current measurement according to a magnitude of the input current signal.

Precision dynamic range expansion for current measurement

A measurement circuit comprises an electronic circuit, multiple measurement channels, and a combining circuit. The electronic circuit includes a first terminal, a second terminal, and a non-resistive circuit element. Each of the multiple measurement channels includes a differential input connected to the electronic circuit. The differential inputs of the multiple measurement channels are connected in series and include a differential input coupled to the non-resistive circuit element. One input of a differential input of a first measurement channel of the multiple measurement channels is connected to the first terminal of the electronic circuit and one input of a differential input of a second measurement channel of the multiple measurement channels is connected to the second terminal of the electronic circuit. The combining circuit receives multiple outputs from the multiple measurement channels and produce a composite output signal.

Electrical signal measurement using subdivision

A self-routing capacitor for an integrated circuit having: a first electrode comprising a first base region and a first finger, the first finger extending from a wall of the first base region in a first direction; a second electrode comprising a second base region and a second finger; the second finger extending from a wall of the second base region in a second direction substantially parallel to and opposing the first direction, the second finger coupled to the first finger; a third electrode comprising a third base region and a third finger, the third finger extending from a first wall of the third base in the second direction; and a fourth electrode comprising a fourth finger, the fourth finger extending from a second wall of the third base region in the first direction. The capacitor being coupled to other metal layers through a base region of an electrode.

High density self-routing metal-oxide-metal capacitor

An analog-to-digital converter (ADC) system configured to receive a first and a second analog quantity and to provide a plurality of numerical parameters representative of the first and second analog quantities. The ADC system includes a first, a second, and a third ADC circuit, and a digital interface circuit. The first ADC circuit is configured to provide a first code representative of the first analog quantity and to provide a first analog residue quantity representative of the first analog quantity with respect to the first code. The second ADC circuit is configured to provide a second code representative of the second analog quantity and to provide a second analog residue quantity representative of the second analog quantity with respect to the second code. The third ADC circuit is configured to receive the first and second analog residue quantities, and to provide a third digital code representative of a difference of the first and second analog residue quantities. The digital interface circuit is configured to receive the first, second, and third codes, and to provide the plurality of numerical parameters representative of the first and second analog quantities.

Growing community of inventors

Andover, MA, United States of America

Micah Galletta O'Halloran