Synopsys, Inc.

Mher Mkhoyan

Yervant Zorian

Karen Darbinyan

Gevorg Torjyan

Arun Kumar

A fully-digital probabilistic measurement methodology in which a periodic signal generated on an IC device is sampled multiple times during a test period, with the asserted/de-asserted state of the periodic signal determined during each sampling event. A statistically significant number of sampling events are executed according to a reference signal frequency that is uncorrelated to the IC's system clock, whereby each successive sampling event involves detecting an essentially random associated phase of the periodic signal such that the probability of detecting an asserted state during any given sampling event is proportional to the duty cycle of the periodic signal. A first count value records the number of sampling events in which the periodic signal is asserted, and a second count value records the total number of sampling events performed, whereby a ratio of these two count values provides a statistical measurement of the periodic signal's duty cycle.

Periodic signal measurement using statistical sampling

Architecture, system and method for providing compression of repair data in an IC design having a plurality of memory instances. In one embodiment, the repair data storage method includes determining repair data for each of the memory instances and compressing the repair data into a compressed format that is stored in a shared nonvolatile storage common to the memory instances.

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Yerevan, Armenia

Mher Mkhoyan