Boston University

Mete Aslan

M Selim Ünlü

Iris Celebi

Celalettin Yurdakul

Allison Marie Marn

Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.

Pixel-diversity nanoparticle detection by interferometric reflectance imaging sensor

An exemplary illumination source is provided. The illumination source includes a light integrating device for coupling to at least one optical structure at an output port. The light integrating device includes at least one input port. At least one light source produces at least one optical illumination coupled to the at least one input port. A light adjusting tool controls the optical illumination emitted by the light integrating device. The light adjusting tool controls uniformity of light emitted by the light integrating device by modifying at least one internal surface of the light integrating device.

Growing community of inventors

Brighton, MA, United States of America

Mete Aslan