Taiwan Semiconductor Manufacturing Comp. Ltd.

Novatek Microelectronics Corp.

Neo Solar Power Corp.

Meng-Hsiu Wu

Calvin Yi-Ping Chao

Shang-Fu Yeh

Chih-Lin Lee

Chin Yin

Hui-Hung Chang

Chin-Hao Chang

Manoj M Mhala

Chiao-Yi Huang

Chien-Liang Chen

Ching-Huang Lin

Chun-Ming Wu

Hsieh-Yi Wu

Yu-Wei Tai

Jui-Lin Wang

Hung-Yang Lin

Chang-Kuei Chung

Sen-Hsiang Hung

Yu-wei Tai

Yang-Fang Chen

A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.

Systems and method to test semiconductor devices

A method of a sensing device, comprising steps of emitting, by a light source of the sensing device, a light pulse in each of n cycles; measuring, by a single photon avalanche diodes array of the sensing device, a time-of-flight value with a resolution of m in each of the n cycles to generate n raw data frames based on a reflected light of the light pulse; performing, by a pre-processing circuit of the sensing device, a pre-processing operation to n raw data frames to generate k pre-processed data frames, wherein m, n and k are natural numbers, and k is smaller than n; and generating, by post-processor of the sensing device, a histogram according to the k pre-processed data frames and analyzing the histogram to output a depth result.

Time-of-flight sensing device and method thereof

Methods and systems to test semiconductor devices based on dynamically updated boundary values

An apparatus and method for providing a filtering false photon count events for each pixel in a DTOF sensor array are disclosed herein. In some embodiments, the apparatus includes: a light source configured to emit a modulated signal towards the object; a direct time of flight (DTOF) sensor array configured to receive a reflected signal from the object, wherein the DTOF sensor array comprises a plurality of single-photon avalanche diodes (SPADs); and processing circuitry configured to receive photon event detection signals from a center pixel and a plurality of pixels orthogonally and diagonally adjacent to the center pixel and output a valid photon detection signal, in response to determining whether a sum of the received photon event detection signals is greater than a predetermined threshold.

High resolution low power inter-correlation SPAD assisted time-of-flight sensor

A sensing device that is configured to determine a depth result based on time-of-flight value is introduced. The sensing device includes a delay locked loop circuit, a plurality of time-to-digital converters, a multiplexer and a digital integrator. The delay locked loop circuit is configured to output a plurality of delay clock signals through output terminals of the delay locked loop circuit. The plurality of time-to-digital converters include a plurality of latches. The multiplexer is configured to select a sub-group of m latches among the latches of the plurality of time-to-digital converters to be connected to the output terminals of the delay locked loop circuit according to a control signal. The digital integrator is coupled to the plurality of time-to-digital converters and is configured to integrate digital outputs generated by the time-to-digital converters in each of n cycles to generate n raw data frames, wherein m and n are natural numbers, and the n raw data frames are used to generate the depth result.

Time-of-light sensing device and method thereof

Disclosed is a time-of-flight sensing apparatus and method. In one embodiment, a system for time-of-flight (TOF) sensing, comprising: a detector array comprising a plurality of single-photon avalanche detectors (SPADs); and a control circuit comprising at least two digital control arrays coupled to the detector array, a counter array coupled to the at least two digital control arrays, and a logical control unit coupled to the counter array and the at least two digital control arrays, wherein the detector array is configured to receive at least one reflected light pulse from a target, wherein a first digital control array, the counter array, and the logical control unit of the control circuit are configured to receive at least one avalanche pulses from each of the plurality of SPADs to determine a first distance between the detector array and the target in a first TOF mode, and wherein a second digital control array, the counter array, and the logical control unit of the control circuit are configured to receive the at least one avalanche pulse from the each of the plurality of SPADs to determine a second distance between the detector array and the target in a second TOF mode.

Method and apparatus for a hybrid time-of-flight sensor with high dynamic range

A pixel circuit includes: a photodiode capable of generating electrical current according to an incoming light signal; a control circuit coupled to the photodiode for selectively coupling a cathode of the photodiode to a first reference voltage to generate the electrical current according to a first control signal; and an output circuit coupled to the control circuit for selectively coupling a second reference voltage to a connecting terminal between the control circuit and the output circuit and to generate an output signal according to a reset signal and a select signal.

Pixel circuit, sensing device, and method thereof

An electronic apparatus with a touch panel including a host controller, an interface unit, and a touch panel control unit is provided. The host controller is used to control an electronic apparatus implemented with the host controller. The touch panel control unit is coupled to the host controller through the interface unit. The host controller transmits an updating information to the touch panel control unit with a format of the interface unit, in which the updating data is used to update the touch panel control unit. The touch panel control unit decodes the updating data to accordingly update.

Electronic apparatus with touch panel and method for updating touch panel

A solar module frame includes two first borders and two second borders. At least one first border includes a first segment and a second segment, where one end of the first segment is connected to one end of the second border, and one end of the second segment is connected to one end of the other second border. The solar module frame includes at least one connection component. One end of the connection component is connected to the other end of the first segment, and the other end of the connection component is connected to the other end of the second segment. Each of the first segment, the second segment, and the connection component includes an external wall, a support wall, a first clamping wall, and a second clamping wall. Each of the first segment and the second segment includes an internal wall.

Solar module frame

Solar cell

A touch sensing system including a touch interface and a processing unit is provided. The touch interface has multiple independent touch blocks. The processing unit is coupled to the touch interface. The processing unit includes an interpolating unit. The interpolating unit interpolates multiple spacing points between two adjacent touch blocks along a first direction to generate multiple first coordinate values. The processing unit determines a central block according to a threshold value and sensing values corresponding to the touch blocks, selects at least one touch block adjacent to the central block as a peripheral block, and determines a touch position on the touch interface according to the number of the spacing points, the sensing value corresponding to the peripheral block, a position of the peripheral block, the sensing value corresponding to the central block, and a position of the central block.

Growing community of inventors

Hsinchu, Taiwan

Meng-Hsiu Wu