Lear Astronics Corporation

Other

Ixia

Melvin G Oster

Nathan H Tobol

Thomas Michael Schurman

Brian K Fuchs

Wayne E Burklund

Otto H Boe

Robert W Edmeads

John A Baker

Kenneth Reid

A process and apparatus for performing a ground fault test of a device is disclosed. A current level may be selected from a plurality of predetermined current levels. A ground fault current may be generated between a first power line and a ground at the selected current level until a ground fault interrupter within the device trips, or until expiration of an on-time period associated with the selected current level. The ground fault current may then be set to zero for an off-time period associated with the selected current level. The process may be repeated for each of the plurality of current levels. When the ground fault interrupter within the device trips, the current level and a time interval from an onset of the ground fault current at the selected level and a time when the ground fault interrupter tripped may be recorded.

Plug-in electric vehicle charger validation and test device

There is disclosed a hot swap adapter having a circuit board, a power connector, a data connector and a circuit board connector. The circuit board may include one more logic devices. The power connector, the data connector and the circuit board connector may attach to the circuit board. The data connector may interface with a serial bus. The circuit board connector may interface with a parallel bus and a power rail. The logic device may provide a conversion from the serial bus to the parallel bus. The logic device may cause current to stop flowing from the power connector to the power rail in response to an over load condition.

Hot swap adapter

A generic interface test adapter for connecting between a test station and a unit under test. The generic interface test adapter includes an interface frame and an interchangeable circuit card assembly that are configured to route the signals between test station and the unit under test. The interface frame includes an interface plane having a plurality of contact pins or spring-loaded probes, and the circuit card assembly has a plurality of contact pads, aligned to mated with the contact pins. The electrical connections between the test station and the unit under test can be reconfigured merely by changing the interchangeable circuit card assembly. A pressure frame is provided to securely hold the circuit card assembly against the interface plane to provide electrical connection. The pressure frame is pulled toward the interface frame by a cam and angled cam slot mechanism operated by a lever arm.

Generic interface test adapter

A failsafe avionics interface unit serves as a protocol converter system for translating data for control purposes from a digital communication bus to an analog control channel as an upgrade or interface to an existing analog control system. The avionics interface unit includes digital interface bus logic, a digital data processor module, an analog interface, and a mode selection circuit. Data communicated over the digital interface bus is periodically translated into equivalent analog control signals. For safety purposes, the avionics interface unit ensures the integrity of the system by repetitively looping back or wrapping the digital equivalents of the analog output signals and comparing them to commanded digital control values. The protocol converter system additionally monitors communications over the digital data bus for data continuity. If the difference between a wrapped digital equivalent of an analog output signal and an expected value exceeds tolerable limits or if communication fails, the system disconnects its interface from control using redundant software and hardware and returns control to the analog control system.

Failsafe digital bus to analog protocol converter system

Growing community of inventors

Newbury Park, CA, United States of America

Melvin G Oster