Intel Corporation

Md Asifur Rahman

Jason W Brandt

Matthew C Merten

Beeman C Strong

Ofer Levy

Frank Binns

Peter Lachner

Itamar S Kazachinsky

Mayank Bomb

Daniel R Bockelman

Yuan-Chuan Steven Chen

Dan Bockelman

Christopher John Brookreson

In accordance with embodiments disclosed herein, there is provided systems and methods for providing status of a processing device with a periodic synchronization point in an instruction tracing system. For example, the method may include generating a boundary packet based on a unique byte pattern in a packet log. The boundary packet provides a starting point for packet decode. The method may also include generating a plurality of state packets based on status information of the processor. The plurality of state packets follows the boundary packet when outputted into the packet log.

Providing status of a processing device with periodic synchronization point in instruction tracing system

Systems, apparatuses, methods, and computer program products for performing silicon debugging and isolating faults in integrated circuits are disclosed. Some embodiments comprise a simulator to simulate operation of one or more portions of a circuit in order to identify elements of the circuit which are related to a fault, a circuit pruner to separate the related elements from other elements of the circuit and correlate the related elements to a physical layout of the elements, and a probe tool to locate one or more of the related elements which cause or contribute to the fault. Alternative embodiments may comprise computer programs for simulating operation of a circuit to determine related elements of a fault, correlating the related elements to a physical layout or arrangement of the elements in the circuit, and testing the related elements via the physical layout to determine which elements contribute to the fault.

Systems and methods for critical node filtering of integrated circuits

A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be detected at the same time in response to the stimulation. A processor collects image data and determines as a function of the collected image data whether the device has a defect. Other embodiments are described and claimed.

Integrated circuit testing with laser stimulation and emission analysis

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Portland, OR, United States of America

Md Asifur Rahman