Omron Corporation

Mayuko Tanaka

Hiroyuki Mori

Katsuki Nakajima

Takako Onishi

Isao Nakanishi

Naohiro Kawai

Yoshiharu Ogura

Keita Saji

Shimpei Fujii

A management system for a manufacturing facility including a manufacturing device including one or more device members for manufacturing a product, and an inspection device, the system including a display unit, a device member information acquisition unit, a product member information acquisition unit, a manufacturing abnormality information acquisition unit, an improvement candidate information acquisition unit configured to acquire improvement candidate information about candidates for improvement in the manufacturing facility, and a management work support unit configured to create list information and to cause the display unit to display the list information, the list information including an aggregated value of abnormalities of each sort during manufacturing the product and an aggregated value of abnormalities of each sort during inspecting the product within a predetermined aggregation time period, for each device member and/or product member as the candidate for improvement.

Management system, management device, management method, and program

An inspection management system having a plurality of processes and managing final inspection performed to inspect a completed product and one or more intermediate inspections performed to inspect an intermediate product manufactured in the processes earlier than a final process includes: an inspection content data acquisition unit that acquires inspection content data including an inspection standard for each inspection item of the product; an inspection content setting unit that sets inspection content based on the inspection content data acquired by the inspection content data acquisition unit; a simulation unit that simulates inspection in accordance with assumed inspection content; an inspection standard calculation unit that calculates an inspection standard more appropriate than a current inspection standard based on the simulation; and an output unit that outputs base information indicating that at least the inspection standard calculated by the inspection standard calculation unit is more appropriate than the current inspection standard.

Inspection management system, inspection management apparatuses, and inspection management method

An inspection management system that manages inspection of an inspection apparatus in a production line including a manufacturing apparatus of a product and the inspection apparatus includes: an acquisition unit configured to acquire inspection content data including an inspection standard for each component; an inspection content setting unit configured to set inspection content; a setting-related information acquisition unit configured to acquire setting-related information including at least a time at which new inspection content is set when the inspection content setting unit sets the new inspection content; a storage unit configured to retain the setting-related information in association with a history of the setting of the inspection content; a setting-related information reading unit configured to read the setting-related information retained in the storage unit; and an output unit configured to be able to output the setting-related information.

Growing community of inventors

Kyoto, Japan

Mayuko Tanaka