Altera Corporation

Malwarebytes Corporation

Mayank Gupta

Peter Smeys

Adam Hyder

Raghuram Sri Sivalanka

A test management system utilizes an adaptive cohort selection technique to dynamically select and update a cohort of clients for testing a feature of a computer security application. The test management system selects an initial cohort based on high level parameters of the test including the feature to be evaluated and the statistical confidence level for the outcome. During the test, the test management system obtains real-time telemetry data relevant to evaluating the test. Depending on how the test is tracking relative to the test objectives, test management system may dynamically modify the cohort by expanding the size of the cohort or changing the cohort membership.

Intelligent real-time adaptive cohort selection for testing of computer security application features

An improved FinFET has a gate structure on only a portion of the available surface on a fin, thereby providing a FinFET with a finer granularity width dimension. To form the FinFET, a first etch-resistant sacrificial layer and a second etch-resistant spacer layer are formed on the fin. The spacer layer is etched anisotropically to remove the spacer layer from the top and upper sidewalls of the fin while leaving the spacer layer on the lower sidewalls of the FinFET. A gate dielectric and conducting layer are then deposited and shaped to form a structure that is effective as a gate only on the top and upper sidewalls of the fin.

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Santa Clara, CA, United States of America

Mayank Gupta