Thomson-csf

Maxime Lailler

Luigi d'Auria

Jean Chazelas

Jean-Charles Renaud

This optoelectronic system for the testing of a main antenna comprises: a test antenna designed to be placed in the field of transmission or reception of the main antenna; an optoelectronic component associated with the test antenna alternatively receiving and sending optical signals from/to remote transmitters/receivers and receiving and/or sending optical signals from/to the test antenna; an electric matching circuit connected between the optoelectronic component and the test antenna. This system thus enables the testing on the spot of an antenna (for example a radar antenna) without disturbing the radiation pattern of this antenna. This semiconductor component is therefore alternatively a modulator or a detector of light radiation, and it is connected by optical fibers to emitters and adapted detectors located out of the field of the antennas to be tested. The cables formed by dielectric materials do not disturb the radiation pattern of the antennas. An optoelectronic system is used to overcome the variations in the characteristics of the semiconductor component, thus averting especially a temperature stabilization of this component.

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St Remy l'Honore, France

Maxime Lailler