General Electric Company

Maxime Beaudoin Pouliot

John Karigiannis

Stephane Harel

Steeves Bouchard

Bernard Patrick Bewlay

David Scott Diwinsky

Ser Nam Lim

Wayne Ray Grady

Xiao Bian

David Cantin

Jean-Philippe Choiniere

Nicolas Saudrais

Jessen Compagnat

Marc Andre Ethier

An inspection system includes an imaging device, visible light source, ultraviolet light source, and at least one processor. The imaging device generates a first image set of a work piece while the ultraviolet light source illuminates the work piece with ultraviolet light to cause fluorescent dye thereon to emit light, and generates a second image set of the work piece while the visible light source illuminates the work piece with visible light. The first and second image sets are generated at the same positions of the imaging device relative to the work piece. The processor maps the second image set to a computer design model of the work piece based on features depicted in the second image set and the positions of the imaging device. The processor determines a defect location on the work piece based on an analysis of the first image set and the computer design model.

Fluorescent penetrant inspection system and method

A system includes one or more processors configured to create a projection matrix based on a three-dimensional (3D) model of a part and sensor data associated with a workpiece in a workspace of a robotic manipulator. The projection matrix provides a mapping between sensor coordinates associated with the sensor data and 3D coordinates associated with the 3D model. The one or more processors are configured to identify a set of sensor coordinates from the sensor data corresponding to a feature indication associated with the workpiece, and to determine from the set of sensor coordinates a set of 3D coordinates using the projection matrix.

Robotic feature mapping and motion control

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Bromont, Canada

Maxime Beaudoin Pouliot