U.S. Philips Corporation

Max Van Der Star

Franciscus P Beenker

Robertus W Dekker

Rudi J Stans

A method for testing a hierarchically organized integrated circuit means first attacks each assembly in sequence thereof, and in each assembly executing an assembly test cycle. Each assembly test cycle within the assembly in question attacks each macro thereof in sequence and conditionally executes therein a test run under selective control of a macro test mode (MTM) signal. The number of hierarchy levels may be other than three. The method may be applicable to separate integrated circuits or to a wired board with a plurality of circuits.

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Huizen, Netherlands

Max Van Der Star