Kromek Limited

Durham Scientific Crystals Limited

Max Robinson

Arnab Basu

Ben Cantwell

Andy Brinkman

Ian Radley

Gary Gibson

Benjamin John Cantwell

John Tomlinson Mullins

A detector device is described comprising an x-ray detector structure having a detection surface defining at least one separately addressable region for detecting incident x-ray radiation intensity thereon, wherein the separately addressable region is divided into a plurality of sub-regions provided on the detection surface each provided with a filter layer on the detection surface, the filter layers of a given separately addressable region comprising discrete and different materials with discrete defined and spectroscopically spaced x-ray absorption edges. A method of device manufacture, and an apparatus and method for the inspection and characterization of materials employing such a detector device, are also described.

Detector device, inspection apparatus and method

A structure including a substrate, an intermediate layer provided and formed directly onto the substrate, a transition region, and a group II-VI bulk crystal material provided and formed as an extension of the transition region. The transition region acts to change the structure from the underlying substrate to that of the bulk crystal. In a method of manufacture, a similar technique can be used for growing the transition region and the bulk crystal layer.

Semiconductor device and method of manufacture thereof

Apparatus for vapor phase growing of crystals having a single multi-zone heater arranged to heat a heated zone to give a predetermined temperature profile along the length of the heated zone. A generally U-shaped tube having a first limb, a second limb, and a linkage connecting the first and second limbs is located on the heated zone. The first limb contains a source material. The second limb supports a seed such that the source material and seed are spaced longitudinally within the heated zone to provide a predetermined temperature differential between the source and seed. The crystal is grown on the seed.

Apparatus for crystal growth

An apparatus and method are described for obtaining radiation interaction data from an object to enable better determination of the composition of the object. A radiation source and a radiation detector system are used to collect both transmitted and scattered radiation, preferably including radiation from at least one forward scatter mode. The detector system is capable of detecting and collecting spectroscopically resolvable information about incident radiation. Each intensity dataset is resolved across at least three of energy bands within the spectrum of the source, and this data may then be processed numerically to enable better determination of the composition of the object.

Apparatus and method for characterisation of materials

A method of and apparatus for obtaining radiation transmission data from a liquid in such manner that allows some data about relative proportions of constituent ingredients to be derived is described. A radiation source and a radiation detector system able to resolve transmitted intensity across a plurality of frequencies within the spectrum of the source are used to produce transmitted intensity data for each such frequency. Measured data is compared numerically to a mass attenuation data library storing mass attenuation data, individually or collectively, for a small number of expected constituent ingredients of the liquid to fit each intensity data item to the relationship given by the exponential attenuation law: I/I=exp [&#x2212;(&#x3bc;/&#x3c1;) &#x3c1;t] in respect of the constituent ingredients and derive therefrom an indication of relative proportions of each constituent ingredient.

Determination of composition of liquids

An apparatus and method for generating and displaying an image of an object is described and includes a radiation source and a series of at least two linear detectors capable of detecting incident radiation after transmission through an object to define a scanning zone there between. The object is moved relative to and through the scanning zone in successive passes along at least two linear directions at an angle to each other. An image generation apparatus generates for each successive pass at least a first image from the first linear detector, a second image from the second linear detector, and a third image. An image display is adapted successively to display at least the first, second and third images and display the monocular movement parallax between the images. Each image is processed before display to reduce distortion attributable to beam spreading in a direction perpendicular to a scan direction.

Apparatus and method for viewing an object

A method and apparatus are described for the collection and interpretation of radiographic data from an object scanned by a suitable radiation source. A radiation detector system is provided that is detecting and collecting spectroscopically resolved information. An object is scanned from a plurality of perspectives, and the resultant data from each perspective resolved into at least three spectroscopic energy bands. For each such resolved spectroscopic energy band an image analysis is performed to derive depth slicing to produce a series of output datasets each comprising a 2-D dataset of intensity information resolved to a single energy band and depth slice.

Radiographic data interpretation

A method of and apparatus for obtaining radiation interaction data related to an image of an object. The method involves using a detector system for detecting and collecting spectroscopically resolvable information about incident radiation, and collecting one or more datasets of information at the detector after interaction with an object. Each dataset is resolved across at least three frequency bands within the spectrum of the source. The ratio between measured intensities is evaluated for at least two pairs of such frequency bands in a given intensity dataset to obtain a numerical indicator in functional relationship with a material property. The numerical indicator is then compared with a library of data characteristics of target materials. An apparatus is also disclosed for inspection of materials.

Method and apparatus for inspection of materials

Device and method of forming a device in which a substrate () is fabricated with at least part of an electronic circuit for processing signals. A bulk single crystal material () is formed on the substrate, either directly on the substrate () or with an intervening thin film layer or transition region (). A particular application of the device is for a radiation detector.

Semiconductor device with a bulk single crystal on a substrate

A method and apparatus for obtaining radiation transmission data including providing a radiation source, e.g., x-ray or gamma-ray source, and a radiation detector system, e.g., x-ray or gamma-ray detection system, spaced therefrom to define a scanning zone therebetween, the detector system capable of detecting and collecting spectroscopically resolvable information about incident radiation. Collecting a dataset of information about radiation incident including transmissivity of an object in the scanning zone at at least one scanning position from radiation transmitted through the object and received at the detector system. Resolving each dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; at least one of the frequency bands corresponding to a characteristically scattered wavelength of a target species to be identified. The absence of or substantial reduction in a transmitted signal intensity at the frequency band is interpreted as the presence of the said target species.

An apparatus and method for obtaining an image of an object. The apparatus comprises a radiation source and a series of two to five linear detectors spaced therefrom to define a scanning zone; means to cause an object to move relative to and through the scanning zone; a direct image generation apparatus to generate an image from the output of a linear detector; an intermediate image generation apparatus configured to generate at least one intermediate image from an adjacent pair of linear detectors, by processing the output of the pair of detectors and generating an image representative of an output intermediate between the two said detector outputs; the image apparatus adapted such that at least five and preferably at least six images are generated in total; an image display adapted successively to display such images and thus display the monocular movement parallax between the images.

Imaging of materials

An apparatus for generating and displaying an image of an object comprising a radiation source and a series of at least two linear detectors capable of resolving incident source radiation spectroscopically spaced therefrom to define a scanning zone therebetween; means to cause an object to move relative to and through the scanning zone in use; an image generation apparatus to generate at least a first image from the output of a first linear detector, a second image from the output of second linear detector, and a third image, such that each such image includes a representation of spectroscopically resolved incident radiation; an image display adapted successively to display at least the first, second and third such images and thus display the monocular movement parallax between the images.

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Shincliffe, United Kingdom

Max Robinson