Johnstech International Corporation

Max A Carideo

Valts Treibergs

Melissa Hasskamp

David T Skodje

Leslie Fliegelman

Pat Joyal

A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.

Contact assembly array and testing system having contact assembly array

A contact assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The contact assembly includes at least one grouping of blades including a first force blade, a second force blade, a first sense blade, and a second sense blade; an electrical insulation layer disposed between the first force blade and the first sense blade and between the second force blade and the second sense blade; and an elongated elastomer. The elastomer is configured to be retained by the first force blade, the second force blade, the first sense blade, and the second sense blade. Each of the first force blade, the second force blade, the first sense blade, and the second sense blade includes a recess having an opening and sized to receive and retain at least a portion of the elastomer.

Contact assembly and kelvin testing system having contact assembly

A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blades in a side by side generally parallel relationship. The blades are configured to be longitudinally slidable with respect to each other. The block also includes an elastomer configured to retain the plurality of blades. Each blade of the plurality of blades includes a first end and a second end opposite to the first end in the longitudinal direction. The plurality of blades is arranged so that the first end of each blade of the plurality of blades is opposite to the first end of an adjacent blade in the longitudinal direction so that the first end of one blade is adjacent the second end of the adjacent blade. The elastomer is at least tubular (e.g., hollow or solid cylindrical) in part and non-conductive.

Compliant ground block and testing system having compliant ground block

A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blade pairs in a side by side generally parallel relationship. Blades in the plurality of blade pairs are configured to be longitudinally slidable with respect to each other. The block also includes at least one elastomer configured to retain the plurality of blade pairs. Each blade pair of the plurality of blade pairs includes a first blade (or a first blade assembly) and a second blade. The first blade (or the first blade assembly) and the second blade are configured to generate scrubbing motions when the device under test is being pressed down on the compliant ground block or is being released from the compliant ground block.

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Plymouth, MN, United States of America

Max A Carideo