Stmicroelectronics S.r.l.

Mauro Foppiani

Vanni Poletto

Daniele Zella

Nicola De Campo

Matteo Brivio

Matteo Venturelli

Matteo Amighini

Andrea Botta

A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.

Testing an electronic circuit having a voltage monitor circuit

In one embodiment, a (pre)driver circuit includes first and a second output terminal for driving an electronic switch that includes a control terminal and a current path through the switch. The arrangement can operate in one or more first driving configurations (e.g., for PMOS), with the first and second output terminals are coupled to the current path and the control electrode of the electronic switch, respectively, and one or more second driving configurations (e.g., for NMOS, both HS and LS), wherein the first and second output terminals of the driver circuit are coupled to the control electrode and the current path of the electronic switch, respectively.

Driver circuit, corresponding device and method

The electronic circuit includes a transistor having a gate terminal, a source terminal and a drain terminal. A resistor has a first terminal connected to the gate terminal and has a second terminal connected to an auxiliary pad. When the electronic circuit is operating in a test phase and is configured for receiving a test signal for performing the test of the transistor, the auxiliary pad is electrically floating. When the electronic circuit is operating in a normal phase and is configured for receiving a supply voltage, the auxiliary pad is electrically connected to a voltage value smaller than the sum of the voltage value of the source terminal with the threshold voltage value of the transistor.

Electronic circuit and method for testing and keeping a MOS transistor switched-off

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Milan, Italy

Mauro Foppiani