Hewlett-Packard Development Company, L.p.

Seagate Technology Incorporated

Mauricio Huerta Alva

Robert G Mejia

Robin Alexis Takasugi

Tracy Ann Sauerwein

Ladawan Johnson

A storage device includes a storage medium and a probe to read from and write to the storage medium. The storage medium has a plurality of storage regions, where each storage region contains information to identify whether another storage region is defective.

Storage device having information to identify defective storage region

A memory card comprising a first modular component that comprises a first host interface and a first host interface module and a device interface module configured to operate a device interface that is coupled to a storage device. The first host interface module is configured to call a function in the device interface module. The first modular component is replaceable with a second modular component that comprises a second host interface and a second host interface module, and the second host interface module is configured to call the function in the device interface module.

Memory card having first modular component with host interface wherein the first modular is replaceable with a second modular component having second host interface

A memory device having a main controller including a host interface and a device interface, a first plurality of arrays of magneto-resistive random access memory (MRAM) cells, a first device controller coupled to the device interface and the first plurality of arrays, a second plurality of arrays of MRAM cells, and a second device controller coupled to the device interface and the second plurality of arrays. The first device controller is configured to communicate with the device interface to pass first data between the first plurality of arrays and the host interface, and wherein the second device controller is configured to communicate with the device interface to pass second data between the second plurality of arrays and the host interface.

MRAM storage device

A method of alternate tape repositioning during data recovery which takes advantage of the reverse half of the tape forward/reverse cycle to perform an error recovery procedure invoking, thereby reducing total data recovery time. In the event that a tape drive fails to read a target data block, the tape continues its linear travel until a forward ramp-up point beyond the target data block is reached. The tape drive changes tape travel direction to a reverse linear travel direction. When the tape heads are on top of the target data block, a first error recovery procedure invoking is performed in the reverse linear travel direction. If the first error recovery procedure invoking fails to recover data, tape continues its reverse linear travel until a reverse ramp-up point past the target data block is reached. Once again, the tape drive changes tape linear travel direction and a second error recovery procedure invoking is executed in the forward linear travel direction. The procedure of advancing tape, changing tape travel direction and invoking an error recovery procedure invoking continues until the data at the target data block is recovered, or until a pre-selected number of error recovery procedures invoking have been executed.

Alternate tape repositioning method during data recovery

A method for identifying faults contributing to a data transfer error in a tape drive. The method includes calculating and comparing a long-term error rate and a short-term error sample. Based upon such calculation and comparison, a pre-selected error recovery procedure may be initialized. The long-term error rate equals a total number of bytes of data transfer error divided by a total number of bytes processed. A short-term error sample includes a number of bytes of data transfer error in a predetermined number of sequential blocks of data divided by the total number of bytes transferred in the predetermined number of sequential blocks of data. The method calculates and monitors a predetermined number of short-term error samples for a predetermined number of sequential blocks of data defining a window. Under normal operational conditions where head/media interface is free of debris, short-term error samples would have values slightly and randomly larger or smaller than long-term error rate. As debris accumulates gradually at head/media interface, the value of succeeding short-term error samples will be larger than the long-term error rate.

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Boise, ID, United States of America

Mauricio Huerta Alva