Lawrence Livermore National Security, LLC

Maurice B Aufderheide

John Edward Heebner

William D Brown

Jeffrey Devin Bude

Kyle Champley

Jerel A Smith

Jeffrey S Kallman

James M Hall

Yuri Anatoly Podpaly

Thomas M Spinka

Raluca A Negres

Stephen G Azevedo

Harry E Martz, Jr

Steven T Yang

Andrea Schmidt

David A Alessi

Craig W Siders

Scott C Wilks

Otto L Landen

Wade H Williams

David Neal Fittinghoff

Andrew J Mackinnon

Isaac Seetho

Andreas J Kemp

Daniel Schneberk

G Patrick Roberson

The present disclosure relates to a time-gated fast neutron transmission radiography system and method. The system makes use of a pulsed neutron source for producing neutrons in a plurality of directions, with at least a subplurality of the neutrons being directed at an object to be imaged. The system also includes a neutron detector system configured to time-gate the detection of neutrons emitted from the pulsed neutron source to within a time-gated window.

Time-gated fast neutron transmission radiography system and method

A method for increasing the MeV hot electron yield and secondary radiation produced by short-pulse laser-target interactions with an appropriately high or low atomic number (Z) target. Secondary radiation, such as MeV x-rays, gamma-rays, protons, ions, neutrons, positrons and electromagnetic radiation in the microwave to sub-mm region, can be used, e.g., for the flash radiography of dense objects.

Burst-mode chirped pulse amplification method

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.

System-independent characterization of materials using dual-energy computed tomography

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Livermore, CA, United States of America

Maurice B Aufderheide