Microsoft Technology Licensing, LLC

Grundium Oy

Matti Pellikka

Pasi Kemppinen

Markus Vartiainen

Klaus Melakari

Seppo Turunen

Petri Jarske

Janne Haavisto

Heikki Jantunen

Lauri Jääskelä

Henri Autio

Kimmo Alanen

According to an aspect, there is provided an apparatus for performing the following. The apparatus obtains, periodically or regularly during imaging of an imaging target, images of different areas of the imaging target. At least some of the images overlap partially with each other. In response to detecting that an image and all images partially overlapping with said image have been obtained, the apparatus marks the image as completed. In response to detecting that a pre-defined number of images are marked as completed but not locked, the apparatus executes a partial image stitching process comprising: performing image stitching on non-locked images based on at least some obtained this far, locking stitched completed images and performing one or more actions. The one or more actions comprising outputting image information via at least one interface and/or storing the image information to a database accessible by a user and/or analysis device.

Continuous image stitching during imaging

There is provided a method for determining colour correction parameters for a digital imaging device. The method comprises simulating target and raw value pairs for a set of colours based on pre-determined sample transmission spectra of the set of colours; i) a sensitivity spectrum of a monochrome sensor of the digital imaging device; and illumination spectra of different colours of a light source of the digital imaging device; or ii)&#x2014;sensitivity spectra of pixels of different colours of a colour sensor of the digital imaging device; and an illumination spectrum of a light source of the digital imaging device. The method comprises determining a colour correction transformation for transforming the raw values to target values, wherein the colour correction transformation is parametrized by transformation parameters; and solving the transformation parameters for the colour correction transformation using an optimization problem.

Colour calibration of an imaging device

There is provided a method comprising receiving at least three images, wherein the images form a number of partially overlapping image pairs, wherein the number of partially overlapping image pairs is at least a number of the received images; forming one or more candidate transformations between the images of the image pairs; constructing a multigraph comprising nodes representing nodal transformations from a composite image to the images of the at least three images, and edges between the nodes, the edges representing the one or more candidate transformations; solving edge weights and the nodal transformations using an optimization problem, wherein the edge weights indicate plausibility of the one or more candidate transformations; and applying the solved nodal transformations in forming the composite image of the at least three images.

Method for image stitching

An apparatus for scanning microscope slides is provided. The apparatus includes an objective; a specimen stage; a camera sensor configured to capture a first plurality of images at a first rate while focus is changed in continuous motion; and a flash unit configured to flash at a second rate, wherein the first rate and the second rate are synchronized.

Microscope comprising a movable objective-camera system with rolling shutter camera sensor and a multi-color strobe flash and method for scanning microscope slides with proper focus

A method for focusing may include receiving a first image stack of a first field of view, the first image stack including images captured with different focus from the first field of view; determining, from the first image stack, a first spatial distribution of focus depths in which different areas in the first field of view are in focus; determining a first local sample thickness and a first sample tilt in the first field of view based on the first spatial distribution of focus depths; and estimating, based on the first local sample thickness and the first sample tilt, a focus setting for capturing a second image stack from a second field of view.

Method, an apparatus and a computer program product for focusing

According to one aspect, there is provided a speaker comprising a body, a surface structure rigidly attached to the body, electro-magnetic deformable plate elements attached to the rigid planar surface structure and configured to bend, when driven with voltage or current source, the surface structure, and electro-magnetic deformable plate element specific band-pass filter for at least one electro-magnetic deformable plate element of the electro-magnetic deformable plate elements, the band-pass filter having at least one electro-magnetic deformable plate element specific pass band.

Speaker arrangement

A pointing detecting device is described. In an embodiment, a device comprises: a display; a processor; a storage containing instructions; wherein the instructions cause the processor to: select a set of points from a point cloud representing a pointing object in proximity or in contact of the display; determine the selected set of points as control points of a computational smooth surface representing the pointing object; determine a point nearest to the display on the computational smooth surface; based on the point nearest to the display, determine a point in a direction of a gradient of a curvature of the computational smooth surface; and report the point as a location of a desired pointing or touch action.

Pointing detection

According to one aspect, there is provided an apparatus comprising a frame and a speaker rigidly attached to the frame, where the speaker comprises a display module and at least one vibrating deformable plate element attached to a bottom surface of the display module and configured to at least partially bend, when actuated, the display module to generate at least one of sound waves or tactile feedback.

A display with a force sensing function has two layers of a reference voltage, for example a ground voltage. One reference voltage layer is inside the display stack. A sensor layer between the two reference voltage layers senses capacitance from the distance between the sensor layer and the reference voltage layer. The capacitance changes according to the force applied to the display, as the display moves slightly when the user presses the display. A thin foam layer allows the distance between the sensor layer and the reference voltage to change. This change is reflected in the measured capacitance. Multiple force sensors also enable detection of the position of the touch.

Force sensitive device

A device is disclosed, comprising: at least one surface of a device casing, at least one acoustic discontinuity on the at least one surface configured to reflect an ultrasonic acoustic signal, at least one piezoelectric transducer coupled to the at least one surface, configured to induce the ultrasonic acoustic signal in the at least one surface and receive a reflected ultrasonic acoustic signal, wherein an occurrence and location of a touch incident on the at least one surface is determined by analyzing the reflected ultrasonic acoustic signal received by the piezoelectric transducer.

Touch sensitive device casing

A force sensitive surface measures force or pressure applied to the surface. The surface may also detect the touch position. The force sensing surface is calibrated with a stylus having a force measuring element. The stylus measures the force information from force applied on the surface and sends the information to the device with the force sensing surface. The device detects the same force and calibrates the force sensing element according to the information received from the stylus. The device may also detect the position of the touch. As the force information obtained from different portions of the surface may be different, the calibration may be repeated for multiple positions on the force and touch sensitive surface. The calibration may also be used to calibrate a position sensing feature on a force sensing surface having multiple force sensors.

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Lempäälä, Finland

Matti Pellikka