Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Carl Zeiss Microimaging Gmbh

Carl Zeiss Jena Gmbh

Carl Zeiss Sms Ltd.

Carl Ziess Microimaging Gmbh

Carl-zeiss-smt Ag

Matthias Wald

Tiemo Anhut

Daniel Schwedt

Helmut Lippert

Beate Böhme

Ralf Wolleschensky

Robert Hauschild

Thomas Kalkbrenner

Ingo Kleppe

Tobias Kaufhold

Michael Goelles

Wolfgang Singer

David R Shafer

Jörg Siebenmorgen

Benno Radt

Christopher Power

Artur Degen

Lars-Christian Wittig

Michael Gölles

Michael Kempe

Yauheni Novikau

Christoph Husemann

Gerhard Krampert

Joerg Steinert

Wolfgang Bathe

Renhu Shi

Dieter Graefe

Saskia Pergande

Alexander Scheps

Harald Schadwinkel

Thomas Mehner

Jörg Schaffer

Beate Boehme

Tierno Anhut

Mario Längle

Beate BÖHME

A microscope, which includes a color splitter that is reflective to excitation radiation, can switch between a first and a second operating mode. A first apparatus can introduce a first cylindrical optical element into the excitation beam path between a light source and the color splitter, when the microscope is in the first operating mode, and a second apparatus can introduce a second cylindrical optical element into the excitation beam path between the color splitter and a scanning apparatus.

Microscope and method for light-field microscopy with light-sheet excitation and for confocal microscopy

An optical assembly in a laser scanning microscope, having an optical scanning unit providing a first pupil plane, a first beam deflecting device, made of a first scanner arranged on the first pupil plane, for scanning excitation radiation in a first coordinate direction, a first focusing device generating a second pupil plane, optically conjugated to the first pupil plane, and a second beam deflecting device for deflecting the excitation radiation. The second deflecting device is arranged on the second pupil plane. A second focusing device to generate a third pupil plane, is optically conjugated to the first pupil plane and the second pupil plane. A third beam deflecting device is arranged on the third pupil plane, and a variable beam deflecting device is provided to switch an optical beam path between a first beam path and a second beam path.

Optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope, and laser scanning microscope

The invention relates to a beam manipulation device for a scanning microscope, comprising a main colour splitter for coupling excitation light into an illumination beam path and for separating excitation light from detection light of a detection beam path, said device comprising a scanner, preferably positioned on a pupil plane, for scanning the excitation light. The device is characterised in that: an additional optical section is provided comprising optical elements which influence a beam path; at least one pupil plane and/or at least one intermediate image plane is formed in the additional optical section by the optical elements which influence the beam path; and an adjustable selection device is provided for activating either a first beam segment of the illumination and/or detection beam path, or the additional optical section, wherein the first beam segment of the illumination and/or detection beam path does not contain a pupil plane of the illumination and/or detection beam path.

Beam manipulation device for a scanning microscope, and microscope

The invention relates to an optical arrangement, particularly for the detection beam path of a multi-spot scanning microscope, comprising a detection plane, in which a detector is positionable, comprising a dispersive device for spectrally splitting detection light. According to the invention, the optical arrangement is characterized in that a distorting optical unit is present for guiding the detection light into the detection plane, said distorting optical unit being arranged downstream of the dispersive device and upstream of a detection plane, and in that a rotating device is present for the relative rotation of a luminous field of the spectrally separated detection light and the distorting optical unit. The invention additionally relates to a multi-spot scanning microscope and a method for operating a microscope.

Optical arrangement, multi-spot scanning microscope and method for operating a microscope

The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The optical assembly according to the invention is characterized in that in addition to a first and a second focusing device, a third focusing device is provided in order to generate a third pupil plane which is optically conjugated to a first pupil plane, a third beam deflecting device is arranged on the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, a first beam deflecting means is provided between the second focusing device and the second pupil plane and the second pupil plane and the third focusing device in order to deflect the excitation radiation and/or manipulation radiation coming from the third focusing device while bypassing the second beam deflecting device in the direction of the second focusing device, a fourth focusing device is provided for generating a fourth pupil plane which is optically conjugated to the third pupil plane, and a variable second beam deflecting means is arranged on the fourth pupil plane in order to switch an optical beam path between a first beam path and a second beam path. The invention additionally relates to a laser scanning microscope.

A microscopy method for three-dimensionally imaging an object, including imaging the object along a beam path into a first image on a first image plane. A first microlens array is arranged on the first image plane, and a second microlens array with the same pitch is arranged downstream of the first array. The two arrays laterally segment the first image and image same into a second image in which the segments are spaced apart and separated by gaps. On a pupil plane downstream of the microlens array, a provided phase mask generates a spot for each segment of the second image according to a pixel diffusion function. A detector detects the shape and structure of the spot, and a controller ascertains a lateral intensity distribution and depth specification from the shape and/or structure of the spot for each segment and generates a depth-resolved image of the object therefrom.

3D microscopy

An optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The assembly an optical scanning unit as a first focusing device for providing a first pupil plane, a first beam deflecting device, which is made of a first scanner arranged in the first pupil plane, for scanning the excitation radiation and/or manipulation radiation in a first coordinate direction, and a second focusing device for generating a second pupil plane, which is optically conjugated to the first pupil plane. A second beam deflecting device is provided for deflecting the excitation radiation and/or manipulation radiation, said second deflecting device being arranged in the second pupil plane. A third focusing device is provided in order to generate a third pupil plane, optically conjugated to the first pupil plane. A third beam deflecting device is arranged in the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, and a variable beam deflecting means is provided in order to switch an optical beam path between a first beam path and a second beam path.

The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane () for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light () into a detection plane (), wherein the detection beam path has at least one first beam course () having first optical beam-guiding means, in particular first lenses and/or mirrors (), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device () for the spatial spectral splitting of the detection light to be measured and a manipulation device () for manipulating the spectrally spatially split detection light. The first optical beam-guiding means together with the dispersive device and with the manipulation device are arranged and designed to produce a spectrally separated and diffraction-limited image of the Input plane into the detection plane. The optical group preferably has a second beam course () having optical beam-guiding means and has a selection device () for selecting the first beam course () or the second beam course (). In further aspects, the invention relates to a method for microscopy and to a microscope.

Optical group for detection light for a microscope, method for microscopy, and microscope

An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.

Arrangement for microscopy and for correction of aberrations

A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

Light-scanning microscope with simplified optical system, more particularly with variable pupil position

Scanning fluorescence microscopes with an observation beam path from a measurement volume to an image plane. A beam combiner is provided for coupling an illumination system and a diaphragm arranged in the image plane for slow composition of the image because of the sequential scanning and subject the sample to loading as a result of inefficient use of the excitation light. The microscope simultaneously detects fluorescence from different focal planes in each case quasi-confocally. The observation beam path between the beam combiner and the image plane has a first diffractive optics for splitting light beams into beam bundles along different orders of diffraction, imparting to the light beams a spherical phase that is different from the other orders of diffraction. A second diffractive optics is provided for the compensation of chromatic aberrations of the split beam bundles, and a collecting optics is provided for focusing split beam bundles into the image plane.

Multifocal scanning fluorescence microscope

A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.

Functionally integrated laser scanning microscope

A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.

Detector device for detection of a spectral portion for a microscope

Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror () for imaging a respective point of the first and second beam deflection units (A,B) onto one another. The concave mirror (), the first beam deflection unit (A), and the second beam deflection unit (B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (). A first distortion caused by the concave mirror () and a second distortion of the imaging caused by the first and second beam deflection units (A,B) at least partly compensate for one another.

Growing community of inventors

Jena, Germany

Matthias Wald