Koninklijke Philips Corporation N.v.

Philips Intellectual Property & Standards Gmbh

Matthias Simon

Walter Ruetten

Christoph Herrmann

Roger Steadman Booker

Herfried Karl Wieczorek

Cornelis Reinder Ronda

Michael Overdick

Rudolph M Snoeren

Heidrun Steinhauser

Rainer Kiewitt

Nicolaas Jan Noordhoek

Bernd Menser

Augusto Nascetti

Thomas Koehler

Gereon Vogtmeier

Herbert Lifka

Hanns-Ingo Maack

Naor Wainer

Rainer Pietig

Christoph Loef

Detlef Uwe Wiechert

Reinder Coehoorn

Kai Eck

Paulus Albertus Van Hal

Johannes Wilhelmus Maria Jacobs

Guenter Zeitler

Carolina Ribbing

Frank Verbakel

Claus Feldmann

Roger Steadman

Jacques Jules Van Oekel

Helga Hummel

Georg Rose

Olaf Wischhusen

Oliver Muelhens

Astrid Lewalter

Jakob W Mulder

Joanna Maria Elisabeth Baken

Walter R&uuml;tten

System (SYS) for supporting X-ray imaging and related methods. The system (SYS) comprises a machine learning module (MLM), a logic (LG) configured to compute output correction information for adjusting an imaging geometry of an X-ray imaging apparatus to achieve a target imaging geometry. A modulator (MOD,L-MOD, H-MOD, S-MOD) is the system is configured to provide a user instruction for imaging geometry adjustment. The user instruction is modulated based on the output correction information. The machine learning module was previously trained on training data including a specific user's responses to previous instructions.

User interface for X-ray tube-detector alignment

An X-ray detector comprises a first scintillator layer, a second scintillator layer, a first photodiode array, a second photodiode array, and at least one light emitting layer. The first scintillator layer is configured to absorb X-rays from an X-ray pulse and emit light. The first photodiode array is positioned adjacent to the first scintillator layer and is configured to detect at least some of the light emitted by the first scintillator layer. The second scintillator layer is configured to absorb X-rays from the X-ray pulse and emit light. The second photodiode array is positioned adjacent to the second scintillator layer and is configured to detect at least some of the light emitted by the second scintillator layer. The at least one light emitting layer is configured to emit radiation such that at least some of the emitted radiation irradiates the first photodiode array, and at least some of the emitted radiation irradiates the second photodiode array.

X-ray detector comprising at least one light emitting layer

A detector includes a first detection layer () and a second detector layer (). The first and second detection layers include a first and second scintillator () (), a first and second active photosensing region () (), a first portion () of a first substrate (), and a second portion () of a second substrate (). An imaging system () includes a radiation source (), a radiation sensitive detector array () comprising a plurality of multi-layer detectors (), and a reconstructor () configured to reconstruct an output of the detector array and produces an image. The detector array includes a first detection layer and a second detector layer with a first and second scintillator, a first and second active photosensing region, a first portion of a first substrate, and a second portion of a second substrate.

Multi-layer radiation detector

Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.

Multi-spectral X-ray detector

The invention relates to an analyzing grid for phase contrast imaging and/or dark-field imaging, a detector arrangement for phase contrast imaging and/or dark-field imaging comprising such analyzing grid, an X-ray imaging system comprising such detector arrangement, a method for manufacturing such analyzing grid, a computer program element for controlling such analyzing grid or detector arrangement for performing such method and a computer readable medium having stored such computer program element. The analyzing grid comprises a number of X-ray converting gratings. The X-ray converting gratings are configured to convert incident X-ray radiation into light or charge. The number of X-ray converting gratings comprises at least a first X-ray converting grating and a second X-ray converting grating. Further, the X-ray converting gratings each comprise an array of grating bars, wherein the grating bars within each X-ray converting grating are arranged mutually displaced from each other in a direction perpendicular to the incident X-ray radiation by a specific displacement pitch. Further, the grating bars of the first X-ray converting grating are arranged mutually displaced from the grating bars of the second X-ray converting grating in the direction perpendicular to the incident X-ray radiation by the displacement pitch divided by the number of X-ray converting gratings.

Analyzing grid for phase contrast imaging and/or dark-field imaging

In the present invention a direct X-ray conversion layer comprises a material having a perovskite crystal structure. This is preferable since this enables constructing an X-ray detector with edge-on illuminated detector elements.

Direct photon conversion detector

The invention relates to a method for producing a radiation detector used to detect ionizing radiation including a first inorganic-organic halide Perovskite material () as a direct converter material and/or as a scintillator material in a detector layer and to a radiation detector comprising a detector layer () produced by means of the steps of the method. In order to provide an approach for producing a thick layer (e.g. above 10 &#x3bc;&#x3b9;&#x3b7;) of Perovskite material suitable for a radiation detector, it is proposed to grow the material selectively on a seeding layer (), yielding in a thick polycrystalline layer. One suitable seeding layer () to grow lead Perovskite material is made of a bromide Perovskite material.

Method for producing a radiation detector and radiation detector

The present invention relates to medical imaging, and in particular a medical imaging detector. In order to improve and facilitate the collection of information, e.g. for medical diagnosis, a medical imaging detector is provided that comprises a first sensor arrangement () and a second sensor arrangement (). The first sensor arrangement is configured to provide a first type of image data belonging to a first imaging modality. The second sensor arrangement is configured to provide a second type of image data belonging to a second imaging modality. The first imaging modality is an X-ray imaging modality, while the second imaging modality is a non-X-ray imaging modality. The first sensor arrangement comprises one or a plurality of first sensor segments () arranged within a first circumferential line () defining a first imaging area (). The second sensor arrangement comprises one or a plurality of second sensor segments () arranged within a second circumferential line () defining a second imaging area (). The first imaging area and the second imaging area at least partly overlap.

Medical imaging detector

The invention relates to a radiation detector () and to a method for manufacturing such a detector. In a preferred embodiment, the radiation detector () comprises an array of photosensitive pillars () that are embedded in a conversion material (). The photosensitive pillars may particularly be diodes connected at their ends to external circuits (). The conversion material () may particularly comprise a powder of scintillator particles () embedded in a matrix of binder.

Radiation detector with photosensitive elements that can have high aspect ratios

A radiation detector device for detecting a primary radiation includes a scintillator which generates a converted primary radiation in response to incoming primary radiation and a photo detector for detecting the converted primary radiation. The radiation detector device further includes a secondary radiation source for irradiating the scintillator with a secondary radiation which has a wavelength different from a wavelength of the first radiation and which is capable of producing a spatially more uniform response of the scintillator to primary radiation.

Reducing trap effects in a scintillator by application of secondary radiation

A detector unit () for detecting electromagnetic radiation (), the detector unit () comprising a conversion material () adapted for converting impinging electromagnetic radiation () into electric charge carriers, a charge collection electrode () adapted for collecting the converted electric charge carriers, a shielding electrode () adapted to form a capacitance with the charge collection electrode (), and an evaluation circuit (to) electrically coupled with the charge collection electrode () and adapted for evaluating the electromagnetic radiation () based on the collected electric charge carriers.

Detector for and a method of detecting electromagnetic radiation

The application describes an X-ray detector, which uses direct X-ray conversion (DiCo) combined with CMOS pixel circuits. DiCo materials have to be used with high voltage to achieve a high field strength. This makes the sensor prone to leakage currents, which falsify the measured charge result. Moreover, most direct conversion materials suffer from large residual signals that lead to temporal artifacts (ghost images) in an X-ray image sequence. A circuit is described, which senses the sensor's dark current including residual signals from previous exposures before the sensor is exposed (again) to X-ray, and freezes relevant circuit parameters at the end of the sensing phase in such way, that the dark current (leakage current and residual signal) can still be drained during exposure. Therefore, the charge pulses generated in the sensor due to X-ray exposure can be integrated without charges carried by the leakage current or residual signal, thus obtaining a more accurate estimate of the deposited X-ray energy.

Compensation of leakage current and residual signals for integrating detector based on direct X-ray conversion

A method for providing information about a spatial gain distribution of a scintillator for a primary radiation is provided which does not require the irradiation of the scintillator with the primary radiation. The method comprises the step of irradiating the scintillator with a secondary radiation for generating an image of a spatial secondary gain distribution of the scintillator for said second radiation. The spatial secondary gain distribution image corresponds to an image of the spatial primary gain distribution for the primary radiation. In an embodiment of the invention, i.e. in an X-ray imaging device where the primary radiation is X-ray radiation, the invention provides for an accurate calibration of the X-ray detector without irradiating the X-ray detector with X-ray radiation. Rather, irradiation with UV radiation as the secondary radiation provides the desired spatial secondary gain distribution image which can be used for calibration.

Determination of a spatial gain distribution of a scintillator

Systems and methods for data acquisition in computed tomography (CT) applications are provided. The systems and methods are particularly adapted for scanning and acquiring/processing data in connection with high-power cone-beam CT applications. The electron beam is moved/scanned along the anode surface to multiple focal positions. Data acquisition for a full projection at one focus position and one view angle is achieved by activating each focus position multiple times during the data acquisition for one angle of the gantry. The detector array and associated data processing system are adapted to rapidly switch between the different focus positions during the acquisitions for one view angle and to collect all data belonging to the same projection into the same data set. Adaptive electron optics are utilized to move/scan the electron beam along the anode surface to the various focus positions. Alternatively, a plurality of cathodes may be provided for respective focus positions and the system may support fast switching therebetween to achieve desirably short spot times. The disclosed CT system permits greater power densities without risk of heat damage to the anode and effectively increases the track velocity of the electron beam on the anode surface. The CT system and associated data acquisition methods have particular utility in CT applications requiring increased time resolution and/or spatial resolution, e.g., cardiac CT applications.

Systems and methods for scanning and data acquisition in computed tomography (CT) applications

A method for manufacturing a photo-responsive device having a photo-sensitive layer is proposed. The method comprises the following steps: a) providing a clean substrate inside an evacuated evaporation chamber; b) evaporating lead oxide (PbO) from a first crucible to form a seeding layer on the surface of the substrate; c) affecting upon the seeding layer such that only tetragonal lead oxide forms the seeding layer and/or such that the initially grown orthorhombic lead oxide forming the seeding layer is transformed into tetragonal lead oxide; and d) continuing to evaporate lead oxide until the final thickness of the photo-sensitive layer has been deposited onto the substrate. As a result the method yields a photo-responsive device comprising a photo-sensitive layer of lead oxide, which entirely consists of tetragonal lead oxide.

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Aachen, Germany

Matthias Simon