Abberior Instruments Gmbh

Matthias Reuss

Lars Kastrup

Benjamin Harke

Christian Wurm

Gerald Donnert

Joachim Fischer

Roman Schmidt

Matthias Henrich

Andreas Schoenle

Andreas Schönle

Joern Heine

Haugen Mittelstaedt

Haugen Mittelstädt

Jörn Heine

Patrick Hoyer

The present specification relates to a method for light microscopic examination of a sample (), in particular by means of laser scanning or MINFLUX microscopy, in which a drift of the sample () or of an object in a sample () with respect to the light microscope () is detected and, if necessary, corrected. In particular, the present specification relates to a corresponding method for examining the sample () using laser scanning or MINFLUX microscopy. For this purpose, reference markers () are located in the sample, the position of which is repeatedly determined according to the MINFLUX principle in order to determine the drift.

Method and light microscope for a high-resolution examination of a sample

A fluorescence microscope () includes a sample illumination beam path including a source () for illumination light, a first wave front modulator () for providing the focused illumination light () with a central intensity minimum, a beam splitter () and a second adjustable wave front modulator () arranged in a pupil plane () of an objective (). A first detection beam path section including the second wave front modulator () and a telescope () and ending at the beam splitter () coincides with the sample illumination beam path. A separate second detection beam path section includes a detector () for luminescence light from a sample. The telescope () images a first pupil () formed in the pupil plane () in a smaller second pupil (), and transfers a beam of the illumination light () collimated in the second pupil () into an expanded beam collimated in the first pupil ().

Fluorescence microscope with stabilized adjustment and group of components and module for upgrading a fluorescence microscope

An apparatus for selectively shaping phase fronts of a first light beam that is incident along an optical axis and that has a first linear input polarization direction running orthogonal to the optical axis comprises birefringent optical material arranged in all or all bar one of at least three different partial areas that follow to one another in a direction around the optical axis. The optical material is arranged such that a phase of the first light beam is delayed differently in the different partial areas to an extent that increases from partial area to partial area over a round around the optical axis, whereas a phase of a second light beam that is incident along the optical axis and that has a second linear input polarization direction orthogonal to the first linear input polarization direction and to the optical axis is not delayed differently in the different partial areas.

Apparatus for selectively shaping phase fronts of a light beam, and use thereof

For setting a laser-scanning fluorescence microscope to a correct alignment in which an intensity maximum of excitation light and an intensity minimum of fluorescence inhibition light coincide in a focal area of an objective lens, a structure in a sample marked with a fluorescent dye is scanned with the intensity maximum of the excitation light to generate first and second pictures of the sample, the first picture corresponding to a higher and the second picture corresponding to a lower intensity of the fluorescence inhibition light. A spatial offset of a first image of the structure in the first picture with regard to a second image of the structure in the second picture is calculated; and the intensity maximum of the excitation light is shifted with regard to the intensity minimum of the fluorescence inhibition light in the direction of the offset calculated to set the microscope to the correct alignment.

Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system

A high resolution laser scanning microscope has beam shaping elements configured to shape a beam of fluorescence inhibiting light which is directed into a back aperture of an objective connected to form an intensity minimum delimited by intensity maxima of the fluorescence inhibiting light in a focus of the objective. A plurality of optical elements including the objective and the beam shaping elements are arranged in a beam path of the beam to the focus. Using the microscope includes removing or exchanging or altering or adding at least one of the optical elements arranged in the beam path of the beam of fluorescence inhibiting light, and compensating a variation of polarization varying properties of the plurality of the optical elements, that is caused by removing or exchanging or altering or adding the at least one optical element, by adapting the beam shaping elements to the variation.

Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope

A scanner head for high-resolution scanning fluorescence microscopy comprises

Scanner head and device with scanner head

A device comprises two polarization-selective optical elements for separately modulating wave fronts of two components of a collimated light beam, which are transversally polarized in orthogonal directions. The two polarization-selective optical elements are first and second partial areas of one spatial light modulator (SLM) diffracting the light beam in backward direction. A mirror arranged between the first and second partial areas of the SLM reflects the light beam coming from the first partial area towards the second partial area. A wave plate arranged between the first partial area and the second partial area of the SLM rotates the polarization directions of both components of the light beam by 90&#xb0;. The mirror reflects the first and second components of the light beam as parallel bundles of light rays resulting in a lateral offset between the first and second components of the light beam behind the second partial area of the SLM.

Growing community of inventors

Goettingen, Germany

Matthias Reuss