International Business Machines Corporation

Matthias Pflanz

Christian Jacobi

Hans-Werner Tast

Kai Oliver Weber

Martin Eckert

Christian Habermann

Ralf Winkelmann

Udo Krautz

Chung-Lung K Shum

Viresh Paruthi

Juergen Pille

Aaron Tsai

Otto Andreas Torreiter

Thomas Gentner

Quintino Lorenzo Trianni

Eckhard Kunigkeit

Marta Junginger

Stefan Schuh

Jens Dittrich

Various aspects of the present invention disclose a test device that includes a retaining element retaining one or more nuclear radiation sources for performing a nuclear radiation stress test of data storage structures of integrated circuits on a wafer in a wafer prober. The retaining element includes one or more apertures for applying nuclear radiation from the one or more nuclear radiation sources to the data storage structures. The retaining element is configured for controlling the nuclear radiation applied via the one or more apertures. The controlling includes a varying of relative positions of the one or more nuclear radiation sources and the one or more apertures. Additional aspects of the present invention disclose a testing method, computer program product, and computer system for performing the nuclear radiation stress test. In an example aspect, embodiments of the present invention disclose a test device for a wafer prober.

Stressing integrated circuits using a radiation source

A functional testing high-speed serial link system includes a testing controller that generates a functional testing program, and a device under test (DUT) that receives the functional testing program. The DUT includes a first logic circuit array that generates first results in response to executing the functional test program. The system also includes a supporting chip that receives the functional testing program. The supporting chip includes a second logic circuit array that generates second results in response to executing the functional test program. A physical data link establishes signal communication between the DUT and the supporting chip. The testing controller diagnoses the physical link based on a comparison between expected diagnostic results associated with the functional testing program, and at least one of the first results and the second results.

Functional testing of high-speed serial links

A data processing system including multiple processors with a hierarchical cache structure comprising multiple levels of cache between the processors and a main memory, wherein at least one page mover is positioned closer to the main memory and is connected to the cache memories of the at least one shared cache level (LLL), the main memory and to the multiple processors to move data between the cache memories of the at least one shared cache level, the main memory and the processors. In response to a request from one of the processors, the at least one page mover fetches data of a storage area line-wise from at least one of the following memories: the cache memories and the main memory maintaining multiple processor cache memory access coherency.

Data processing in a multiple processor system to maintain multiple processor cache memory access coherency

A method and system for verifying a logic circuit design using dynamic clock gating is disclosed. The method comprises choosing at least one master seed to determine initial values as initialization for said logic circuit and/or stimuli data for at least one interface of said logic circuit, choosing at least two different dynamic clock gating configurations for every chosen master seed, executing a functional simulation with said logic circuit for every chosen dynamic clock gating configuration by using said determined initialization and/or stimuli data based on a corresponding master seed, comparing simulation results of functional simulations against each other executed with said logic circuit for at least two different chosen dynamic clock gating configurations, and reporting an error if said at least two simulation results are not identical.

Verification of logic circuit designs using dynamic clock gating

Controlling an unreliable data transfer in a data channel from a transmitting unit to a receiving unit. A bypass mode or a buffer mode is activated depending on the error rate in the data channel. If bypass mode is selected, data packets are directly transferred in probation from the transmitting unit to the receiving unit by a bypass line. The data packets are error checked after the data transfer. If buffer mode is selected, data is transfer from the transmitting unit to the receiving unit by a buffer line via an error detecting and correcting unit and a buffer unit. The errors are detected and corrected during the data transfer.

Controlling an unreliable data transfer in a data channel

A method for handling errors in a cache memory without processor core recovery includes receiving a fetch request for data from a processor and simultaneously transmitting fetched data and a parity matching the parity of the fetched data to the processor. The fetched data is received from a higher-level cache into a low level cache of the processor. Upon determining that the fetched data failed an error check indicating that the fetched data is corrupted, the method includes requesting an execution pipeline to discontinue processing and flush its contents, and initiating a clean up sequence, which includes sending an invalidation request to the low level cache causing the low level cache to remove lines associated with the corrupted data, and requesting the execution pipeline to restart. The execution pipeline accesses a copy of the requested data from a higher-level storage location.

Method, system, and computer program product for handling errors in a cache without processor core recovery

An improved method, system and computer-readable medium for constructing binary decision diagrams for a netlist graph is disclosed. The method comprises traversing a netlist graph in a depth-first manner. At least one binary decision diagram is built for one input of a node of the netlist graph using a binary decision diagram for the other input of that node as a don't-care condition.

Method and system for building binary decision diagrams optimally for nodes in a netlist graph using don't-caring

A new and convenient methodology for proving the correctness of multiplier and multiply-accumulate circuit designs in a full custom design flow. Such an approach utilizes a basic description of the implemented algorithm, which is created in early phases of the design flow and requires only little extra work for the designer who spends most of the time in full-custom optimizations. Such an approach also defines arithmetic circuit at the arithmetic bit level and allows for the generation of a gate level netlist. Given a structural similarity between the specification and design under verification, a large amount of structural similarity between the generated netlists is obtained so that a standard equivalence checker can be utilized to verify the design against the specification.

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Holzgerlingen, Germany

Matthias Pflanz