Abberior Instruments Gmbh

Matthias Henrich

Joachim Fischer

Winfried Willemer

Lars Kastrup

Gerald Donnert

Matthias Reuss

Andreas Schoenle

Andreas Schönle

Patrick Hoyer

Jörn Heine

Haugen Mittelstädt

The present disclosure relates to method, computer programs with instructions, and apparatus for determining positions of two or more spaced-apart molecules in one or more spatial directions in a sample by means of a localization microscope. The present disclosure also relates to localization microscopes using such an apparatus. Light distributions arising due to interference of coherent light are used for determining the positions of the molecules. In the method, a plurality of light distributions are generated (S) using a first light modulator having a plurality of switchable pixels. The first light modulator is arranged in an image plane of the localization microscope. Each light distribution has a local intensity minimum and regions with an intensity increase adjacent thereto. Each of the two or more molecules is illuminated (S) with one light distribution. For each of the light distributions, photons emitted by the molecules are detected (S) for different positionings of the light distribution. The light distributions are positioned (S) independently of each other. Based on the photons detected for the different positionings of the light distributions, the positions of the molecules are finally derived (S).

Method, computer program and apparatus for determining positions of molecules in a sample

An auxiliary apparatus for testing the confocality of a scanning and descanning microscope component group has a connector configured for connecting the auxiliary apparatus in a defined relative position to the scanning and descanning microscope component group, and an optical axis running at a fixed orientation with respect to the connector. Further, the auxiliary apparatus has an auxiliary detector with a plurality of auxiliary detection apertures in a plurality of auxiliary detection aperture positions that are arranged at distances in direction of the optical axis and laterally with respect to the optical axis; and an auxiliary light source providing auxiliary light through a plurality of auxiliary emission apertures in a plurality of auxiliary emission aperture positions arranged at distances in direction of the optical axis and laterally with respect to the optical axis.

Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group

A bandpass filter for light has variable lower and upper cut-off wavelengths. The bandpass filter comprises an areal long-pass filter defining the variable lower cut-off wavelength and an areal short-pass filter defining the variable upper cut-off wavelength. The long-pass filter has different lower cut-off wavelengths in different first area regions which follow to one another in a first direction, and the short-pass filter has different upper cut-off wavelengths in different second area regions which follow to one another in a second direction. The long-pass filter and the short-pass filter are connected in series and spatially fixed relative to one another. The first direction and the second direction are oriented crosswise to one another.

Bandpass filter for light having variable lower and upper cut-off wavelengths

An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area. The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.

Apparatus for monitoring a focal state of microscope

For checking the confocality of a scanning and descanning microscope assembly comprising a light source providing illumination light focused into a focal area in a focal plane, a detector detecting light coming out of the focal area and having a detection aperture to be arranged in a confocal fashion with respect to the focal area, and a scanner, an auxiliary detection aperture of an auxiliary detector arranged in the focal plane is scanned with the focal area of the illumination light to record a first comparison intensity distribution of the illumination light registered by the auxiliary detector, and the detection aperture of the detector is scanned with auxiliary light that exits out of an auxiliary emission aperture of an auxiliary light source concentrically arranged with respect to the auxiliary detection aperture in the focal plane to record a second comparison intensity distribution of the auxiliary light registered by the detector.

Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly

A scanner head for high-resolution scanning fluorescence microscopy comprises

Growing community of inventors

Heidelberg, Germany

Matthias Henrich