Atmel Germany Gmbh

Xenios Ag

Matthias Heinke

Heinrich Wieczorek

Marco Schalk

A device is provided for subjecting a plurality of singulated semiconductor components to functional verification, which includes contact pins that are integrated in a test socket and establish a mechanical and electrical contact between the test socket and the integrated semiconductor circuits, a holding fixture (DUT board) connected to the test socket for transmitting electrical signals to and from a program-controlled electronic switching system, and lines and control devices for operating at least one pneumatic transport and holding device for picking up, orienting and positioning the singulated semiconductor components, an inert gas is provided as the medium for operating the pneumatic devices.

Growing community of inventors

Heilbronn, Germany

Matthias Heinke