Infineon Technologies Ag

Matthias Grewe

Peter Mayer

Stefan Dietrich

Markus Rohleder

Armin Rettenberger

Jörg Weller

A method for testing an electronic module having a memory cell device includes writing an information item to the memory cell device at a first clock frequency and then reading-out the information item from the memory cell device at a second clock frequency. The read out information item is reflected at a reflection point and is written back to the memory cell device at the second clock frequency. The reflected information unit is then read-out from the memory cell device with the first clock frequency.

Test method and test apparatus for an electronic module

In a configuration for checking an address generator, a memory apparatus is configured such that it can store values of address signals that are present on lines of an address bus. The stored values can then be output to at least one access point where the values are provided for further evaluation.

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Munich, Germany

Matthias Grewe