Vishay Semiconductor Gmbh

Atmel Germany Gmbh

Dr. Ing. H.c. F. Porsche Aktiengesellschaft

Temic Telefunken Microelectronic Gmbh

Melexis Gmbh

Atmel Automotive Gmbh

Matthias Eichin

Alexander Kurz

Rolf Bohme

Thomas Mistele

Thomas Ohl

Karl-Ulrich Stahl

Bastian Luther

A method for monitoring a door contact switch of a driver's door of a motor vehicle locked in an idle state includes detecting an unlocking of the driver's door of the motor vehicle, and detecting whether a change in a door contact signal of the door contact switch takes place after the unlocking of the driver's door. If a change in the door contact signal has been detected, a plausibility counter is initialized, otherwise the method includes detecting whether a drive unit of the motor vehicle is activated. A 'door contact implausible' state is established and the plausibility counter (P) is incremented if the activation of the drive unit has been detected in step d).

Method for monitoring a door contact switch of a driver's door of a motor vehicle

A process for controlling an electrically driven window pane for a motor vehicle which has an operating element for triggering the pane motion. After the operation of the operating element, the window pane is moved by a driving motor until a soft-stop position is reached, the motion of the driving motor being detected for determining the window pane position. A multiple operation of the operating element within a definable time period causes an overshooting of the soft-stop position to the mechanical stop, in which the position of the pane is newly defined.

Process for controlling an electrically driven motor vehicle window

In a method for interference suppression using a quality-adjustable bandpass filter in a receiver circuit for carrier-modulated received signals (S), the bandpass filtered received signal (B) is demodulated, and a switching process is triggered with the demodulated received signal (D). In order to eliminate internal or self-induced interferences that would be caused by a switching process in the output portion of the receiver, a quality reduction of the bandpass filter is correlated with the switching process that causes the interference. The method is especially suitable in connection with circuits for infrared receivers, which can thereby be manufactured in a small size, without external components, and thus economically.

Method and arrangement for noise rejection in a receiver circuit

An energy-saving method for wireless reception of data modulated on a carrier signal is carried out in a receiver circuit including a first group and a second group of circuit elements. The first group of the circuit elements required for recovering the data from the modulated carrier signal are supplied intermittently with electrical energy, while the remaining circuit elements of the second group are supplied with uninterrupted electrical energy. After an intermittent unpowered phase without electrical energy being supplied to the first group of circuit elements, the receiver can be operated in the next intermittent powered phase of the second group of circuit elements with parameters that determined the receiver properties which were present in the last reception phase and that have been stored, thus eliminating the time required for renewed tuning in.

Energy-saving method for the wireless reception of data modulated on a carrier signal

An integrated circuit can be tested externally at its normal signal output pin(s) without requiring additional testing output pins or test measuring pads. The integrated circuit includes a circuit unit that generates a normal output signal provided to the signal output pin in a normal operating mode and generates a test signal in a testing mode, a switching element that selectively does or does not connect the test signal from the circuit unit to the signal output pin, and a control unit that controls the switching element with a control signal responsive to the potential level present at the signal output pin. When the circuit is to be tested, a defined voltage is applied to the signal output pin by a voltage divider formed of resistors between a supply voltage and a reference voltage. This causes the control unit to close the switching element.

Integrated circuit that can be externally tested through a normal signal output pin

In previously known methods for testing internal signals of an integrated circuit, additional output pins were required which, in general, were linked to additional measuring pads within the integrated circuit. In the new method, the circuit functions are tested by using the output pins at which the output signal is present during normal operation of the integrated circuit. By means of a simple, external connection, with which a defined voltage value is set at the signal output, the integrated circuit is switched by means of an integrated control unit into a test mode in which it applies selected signals, which are to be tested, at the signal output. There is no need for additional internal measuring pads or additional output pins.

Method for testing an integrated circuit with an external potential applied to a signal output pin

A heterodyne receiver operating on the principle of synchronous modulation for time-signal reception where a first mixer is driven by the first phase-locking loop which is fed from a reference frequency source and a switchable precharging value. By means of switched frequency dividers and the precharging values, internationally different clock frequencies (JP: 40 kHz; USA/GB: 60 kHz; EU/D: 77.5 kHz) can be processed and converted to the intermediate frequencies. These are then synchronously demodulated by means of a second mixer which receives its signal from the second phase-locking loop that is driven through the intermediate frequency signal via the phase comparator, and also through the control signal of the phase-locking loop, so that only residual error adjustment need be performed.

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Heilbronn, Germany

Matthias Eichin