Hand Held Products, Inc.

Baker Hughes Oilfield Operations LLC

General Electric Company

Welch Allyn Data Collection, Inc.

Other

Honeywell International Inc.

Baker Hughes, a Ge Compnay, LLC

Welch Allyn, Inc.

Matthew William Pankow

Robert M Hussey

Charles Paul Barber

Robert C Gardiner

George S Smith, Ii

Edward C Bremer

Timothy P Meier

Carl W Gerst

Carl W Gerst, Iii

Kevin Andrew Coombs

Stephen Patrick Deloge

Melissa Rose Stancato

Bryan David Maule

Kevin Bower

Andrew Longacre, Jr

Thomas Hawley

Joseph Livingston

Daniel Van Volkinburg

Ryan Kather

Ynjiun P Wang

Clark Alexander Bendall

James J Delmonico

Thomas Charles Ward

John A Pettinelli, Jr

George S Smith

Nicholas Anthony Stancato

Sheldon McCrackin

Carlneil Domkam

Jeremy Vandam

Thomas Bianconi

Samvid Jhaveri

Bill Field

Joseph John Waclawski

Dennis Lavin

Brice Kim

David Scott Andreasen

Tom Lambdin

Brian L Jovanovski

Jeffrey Dean Harper

Andrew E Reynolds

James A Parker

James Rosetti

Todd A Dueker

Thomas Ruhlman

David M Holzhauer

Bradley A Randolph

John Pettinelli

Paul F Denimarck, Jr

John A Pettinelli

Melissa Fiutak

Changnian Huang

Joseph Guszcza

Louis Bruno

David Marrs

George S Ii Smith

Carl W Iii Gerst

Joseph Walczyk

Data is received which can characterize a two-dimensional image and a set of three-dimensional surface points. The two-dimensional image can characterize at least a tip of a blade and a portion of a shroud, and the three-dimensional surface points can characterize the tip of the blade and the portion of the shroud. A first location of an edge of the blade and a second location of a surface of the shroud can be determined based on the data. A distance between the first location of the edge of the blade and the second location of the surface of the shroud can be determined based on the data. The distance can be provided. Related apparatus, systems, techniques and articles are also described.

Automated turbine blade to shroud gap measurement

A method of adaptive inspection includes receiving data characterizing one or more images of an inspection region of an industrial machine acquired by an inspection system operating based on a first set of operating parameters. The inspection region includes a site feature. The method also includes determining, by an analytical model, one or more characteristics of the inspection region from the received data characterizing the one or more images of the inspection region. The method further includes generating a control signal based on the one or more characteristics of the inspection region and/or a user input. The inspection system is configured to perform a new inspection of the inspection region based on the control signal.

Adaptive borescope inspection

A method for customizing non-destructive testing is provided and includes receiving, by a non-destructive testing (NDT) device, a stock application. The method further includes the device performing a stock NDT function in response to execution of the stock application. The stock NDT function can include a first device manipulation, a first NDT data acquisition by a device sensor, a first analysis employing data acquired by the first NDT data acquisition, or a first NDT output. The method additionally includes the device receiving a custom application after receipt of the stock application. The method also includes the device performing a custom NDT function, different from the stock NDT functions, and including at least one of a second device manipulation, a second NDT data acquisition by a sensor of the device, a second analysis employing data acquired by the second NDT data acquisition, or a second NDT output.

Non-destructive testing device customization

A method for is provided. The method can include receiving data characterizing a first measurement image having a first state and a first set of three-dimensional coordinate data corresponding to the first measurement image. The first measurement image can include two-dimensional image data. The method can also include receiving data characterizing at least one geometric dimension determined for the first measurement image. The method can further include receiving data characterizing a second measurement image having a second state and a second set of three-dimensional coordinate data corresponding to the second measurement image. The method can also include applying the first state of the first measurement image to the second measurement image. The method can further include displaying at least one second geometric dimension determined using the second set of three-dimensional coordinate data. Related systems performing the method are also provided.

Methods, systems, and computer-readable media for articulating visual inspection devices are provided. For example, a method can include receiving an inspection template by a control system associated with the visual inspection device. The inspection template can include data associated with at least one point of interest in a scene viewable to the visual inspection device. The method can further include generating, by the control system, an articulation path based on the data. The method can also include actuating an electro-mechanical system of the visual inspection device according to the articulation path.

Method and system for articulation of a visual inspection device

A terminal for measuring at least one dimension of an object includes at least one imaging subsystem and an actuator. The at least one imaging subsystem includes an imaging optics assembly operable to focus an image onto an image sensor array. The imaging optics assembly has an optical axis. The actuator is operably connected to the at least one imaging subsystem for moving an angle of the optical axis relative to the terminal. The terminal is adapted to obtain first image data of the object and is operable to determine at least one of a height, a width, and a depth dimension of the object based on effecting the actuator to change the angle of the optical axis relative to the terminal to align the object in second image data with the object in the first image data, the second image data being different from the first image data.

Terminals and methods for dimensioning objects

Systems and methods provided herein. In one embodiment, a borescope system includes a probe to capture images and a display a settings menu, measurements, the images captured by the probe, or any combination thereof. In addition, the borescope system a processor programmed to display a user interface to enable a user to control movement of the probe, adjust settings, navigate menus, make selections, or any combination thereof. The processor is communicatively coupled to the probe, and the display, and is programmed to instruct the borescope to enter a live menu view when an articulation mode is selected from the settings menu. In the live menu view, the processor is programmed to instruct the display to display the images captured by the probe, and to enable a user to control the movement of the probe and adjust articulation sensitivity of the probe while viewing the images on the display.

Borescope steering adjustment system and method

An indicia reading terminal is disclosed that eliminates unwanted flickering effects in an illuminated screen reading mode, among other advantageous features. The indicia reading terminal, in response to a screen reading signal, is operative to activate a screen reading cycle. In the screen reading cycle, an imaging subsystem is activated at least once at the same time that an illumination subsystem is activated for one of a plurality of active illumination periods, for a first illuminated exposure period. The imaging subsystem is activated at least once while the illumination subsystem is not activated, for a first unilluminated exposure period, which is longer than the first illuminated exposure period. An aimer subsystem is activated for a plurality of active aimer periods when neither the imaging subsystem nor the illumination subsystem is activated, wherein intervals of time between the active aimer periods are equal, within nominal tolerances.

Terminal with flicker-corrected aimer and alternating illumination

There is described an imaging apparatus having an imaging assembly that includes an image sensor. The imaging apparatus can capture a frame of image data having image data corresponding to a first set of pixels of the image sensor. The imaging apparatus can capture a frame or image data having image data corresponding to a second set of pixels of the image sensor.

Imaging apparatus having imaging assembly

A method of operating an image reader typically includes: searching a digital image for nominally straight edges; characterizing the nominally straight edges in terms of length and/or direction; determining a predominant orientation of the nominally straight edges; establishing a group of edges as a function of their proximity to the center of the image; establishing a group of edges as a function of their proximity to other remaining edge positions; and transmuting a rectangle bounding those edges into a rectified image. The rectified image is typically an image that is cropped or rotated.

System and method to manipulate an image

An indicia reading terminal is disclosed that eliminates unwanted flickering effects in an illuminated screen reading mode, among other advantageous features. The indicia reading terminal, in response to a screen reading signal, is operative to activate a screen reading cycle. In the screen reading cycle, an imaging subsystem is activated at least once at the same time that an illumination subsystem is activated for one of a plurality of active illumination periods, for a first illuminated exposure period. The imaging subsystem is activated at least once while the illumination subsystem is not activated, for a first unilluminated exposure period, which is longer than the first illuminated exposure period. An aimer subsystem is activated for a plurality of active aimer periods when neither the imaging subsystem or the illumination subsystem is activated, wherein intervals of time between the active aimer periods are equal, within nominal tolerances.

Growing community of inventors

Skaneateles, NY, United States of America

Matthew William Pankow