Hutchinson Technology Corporation

Matthew S Lang

Peter Francis Ladwig

Douglas P Riemer

Michael Wayne Davis

Dean E Myers

Clark T Olsen

Ryan N Ruzicka

Zachary A Pokornowski

John L Schumann

Nole D German

Trent A Johnson

Duane M Jelkin

Forrest A Cravens

Kurt C Swanson

Paul Valentine Pesavento

Kyle T Tobias

Lawrence E LaLonde

Dennis R Johnson

Todd Austin Peter

Joseph D Starkey

Todd A Peter

Timothy J Maday

Devices including a substrate and a plurality of coil portions disposed on the substrate. The plurality of coil portions electrically coupled to form a coil structure.

High density coil design and process

A pressure/force sensor comprises a diaphragm structure including a sensing element and a lead structure extending from the diaphragm structure and including first and second traces electrically coupled to the sensing element. The diaphragm structure and the lead structure include a circuit assembly comprising a common insulating layer and a common conductor layer on the insulating layer. The conductor layer includes at least a portion of the sensing element and at least the first trace.

Miniature pressure/force sensor with integrated leads

An inspection system is described. The inspection system includes a camera and a housing. The housing contains a reflective dome. The reflective dome includes an apex and a viewport. The viewport is offset from the apex. The camera is mounted to capture light exiting the reflective dome through the viewport. And, a plurality of light sources are arranged about the reflective dome such that light output from the plurality of light sources enters the dome.

On-axis and diffuse illumination for inspection systems

A radiometer probe for matching a spectral sensitivity of a dry-film resist is provided. The radiometer probe includes a light probe and a filter-diffuser assembly connected to the light probe. The filter-diffuser assembly includes a filter housing configured to receive an optical diffuser positioned on a filter. The optical diffuser and the filter are separated by a spacer.

Photoresist spectral sensitivity matching radiometer for trace/space width variation improvement

A device includes a dielectric layer having a first surface and a second surface. The device also includes a first set of high-aspect ratio electroplated structures disposed on the first surface of the dielectric layer and a second set of high-aspect ratio electroplated structures disposed on the second surface of the dielectric layer opposite the first set of high-aspect ratio electroplated structures.

High-aspect ratio electroplated structures and anisotropic electroplating processes

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Excelsior, MN, United States of America

Matthew S Lang