Luna Innovations Inc.

Matthew Ryan Webster

Kevin Farinholt

Gheorghe Bunget

An inspection apparatus detects one or more characteristics of a material sample and includes a transmitter to transmit an initial signal to the material sample, and a receiver to receive a detected signal from the material sample associated with the initial signal. The detected signal has at least a first harmonic signal component and a second harmonic signal component. Data processing circuitry determines a resonant frequency of the first harmonic signal component and an amplitude of the first harmonic signal component at the resonant frequency, and filters the detected signal using a first filter signal having a frequency corresponding to the first harmonic signal component and a second filter signal having a frequency corresponding to the second harmonic signal component. A frequency analysis is performed in the frequency domain on the filtered first and second signals to determine corresponding first and second amplitudes. The first and second amplitudes may be compensated for nonlinearity. One or more nonlinear parameters are determined based on the first and second amplitudes. A user interface communicates one or more characteristics of the material sample based on the first and second compensated amplitudes.

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Charlottesville, VA, United States of America

Matthew Ryan Webster